TransMissing[reliability_monitor_program_q214] - Maxim

TransMissing[reliability_monitor_program_q214]


Stress Tests
Preconditioning
Operating Life
Storage Life
Temperature Cycle
Temp Humidity Bias
Write Cy/Data Ret'n
Package Integrity

Process Reliability
Epson MBiC3 0.35µm CMOS (MB3)
Epson SiGe HBT 0.18µm BiCMOS (S18)
Fab-7 0.18µm Silicon Gate CMOS (S18)
Hybrid
MFN 3.0µm Silicon Gate CMOS (B3)
MFN 0.8µm Silicon Gate CMOS (B8)
MFN 1.2µm Silicon Gate CMOS (B12)
MFN 0.8µm Silicon Gate CMOS (C3)
MFN Poly Emitter Complementary Bipolar (CB20)
MFN Poly Emitter Complementary Bipolar (CB50)
MFN Standard Metal Gate CMOS (M5)
MFN Dual Poly 0.8µm BiCMOS (MB10)
MFN 3.0µm Silicon Gate CMOS (S3)
MFN 0.18µm Silicon Gate CMOS (S18)
MFN 5µm Silicon Gate CMOS (SG5)
MFN 5µm Silicon Gate CMOS HV (S5HV)
San Antonio 0.6µm Silicon Gate CMOS (E6)
San Antonio 0.4µm Silicon Gate CMOS (4E35)
San Antonio 0.5µm Silicon Gate CMOS (5E35)
San Antonio 0.8µm EEPROM Silicon Gate CMOS (EB8)
San Antonio 0.4µm Silicon Gate CMOS (S4)
San Antonio Silicon Gate CMOS (S18)
X3 0.6µm Silicon Gate CMOS (C6)
X3 0.18µm Silicon Gate CMOS (S18)

Assembly Reliability
DFN
iButton
LGA
PDIP
QFN
QSOP
SOIC
SOT
SSOP
TQFN-CU
TSSOP
µMAX
WLP