MAX6642EVCMOD2

Evaluation System/Evaluation Kit for the MAX6642


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Description

The MAX6642 evaluation kit (EV kit) is an assembled and tested PC board with a mounted MAX6642. The EV kit allows full evaluation of the MAX6642 temperature sensor. The MAX6642 monitors its own die temperature and the junction temperature of an external diode-connected transistor. It converts the temperature to 10-bit, 2-wire serial data that may be accessed over a 2-wire serial bus.

The MAX6642 EV kit includes an external diode-connected transistor (2N3906) soldered to the board, which can be removed. The board can then be connected through a twisted pair to remote diodes close to your system.

The MAX6642 evaluation system consists of a Maxim command module (CMOD232) and a MAX6642 EV kit. The CMOD232 board connects to a computer's RS-232 serial port to provide a computer-controlled SMBus™/I²C bus. Windows® 95/98/2000/XP-compatible software provides a user-friendly interface to exercise the features of the MAX6642. The program is menu driven and offers a graphic interface with control buttons and status display.

Order the MAX6642EVCMOD2 for a complete PC-based evaluation of the MAX6642. Order the MAX6642EVKIT if you already have a CMOD232 SMBus interface.

Key Features

  • Measures and Displays Temperature of the MAX6642 and the Remote Diode
  • Programmable High-Temperature Alarms
  • SMBus/I²C Compatible
  • Easy-to-Use Menu-Driven Software
  • Fully Assembled and Tested
  • Includes Windows 95/98/2000/XP-Compatible Software and Demo PC Board

Applications/Uses

  • Desktop Computers
  • Graphic Cards
  • Notebook Computers
  • Servers
  • Test and Measurement Equipment
  • Thin Clients
  • Workstations

Quality and Environmental Data

Request Reliability Report for: MAX6642EVCMOD2 
Lead-Free Package Tin (Sn) Whisker Reports
Device   Fab Process   Technology   Sample size   Rejects   FIT at 25°C   FIT at 55°C  

Note : The failure rates are summarized by technology and mapped to the associated material part numbers. The failure rates are highly dependent on the number of units tested.

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