MAX1668EVSYS

Evaluation System for the MAX1668


Please check latest availability status for a specific part variant.

Description

The MAX1668 evaluation system (EV system) consists of a MAX1668 evaluation kit (EV kit) and a companion Maxim system management bus (SMBus™) interface board.

The MAX1668 EV kit is an assembled and tested PC board that demonstrates the MAX1668 temperature sensor. It monitors the temperature of four external diode-connected transistors and one internal diode, and converts the temperatures to 8-bit, 2-wire serial data. Four 2N3906 temperature-sensor transistors come soldered to the board in SOT23 packages, but for more realistic experiments, any of the transistors can be removed and the board connected through a twisted pair to remote diodes closer to your system.

The Maxim SMBus Interface Board (MAXSMBus) allows an IBM®-compatible PC to use its parallel port to emulate an Intel® SMBus 2-wire interface. Windows® 95/98/2000 compatible software provides a user-friendly interface to exercise the MAX1668 features. The program is menu driven and offers a graphic interface with control buttons and status display.

Order the MAX1668EVSYS for complete PC-based evaluation of the MAX1668. Order the MAX1668EVKIT if you already have an SMBus interface.

Key Features

  • Measures and Displays Remote and Internal Sensor Temperature
  • Programmable Alarms and Configuration
  • Operating Temperature Ranges
    • -55°C to +125°C (Remote Sensor)
    • 0°C to +70°C (Board)
  • I²C*/SMBus Compatible
  • Easy-to-Use Menu-Driven Software
  • Assembled and Tested
  • Includes Windows 95/98/2000 Compatible Software and Demo PC Board

Applications/Uses

  • Computers: Desktop, Workstation, Server
  • Notebooks – Main Power
  • Servers
  • Workstations

Quality and Environmental Data

Request Reliability Report for: MAX1668EVSYS 
Lead-Free Package Tin (Sn) Whisker Reports

Additional Resources

MAXSMBus
Device   Fab Process   Technology   Sample size   Rejects   FIT at 25°C   FIT at 55°C  

Note : The failure rates are summarized by technology and mapped to the associated material part numbers. The failure rates are highly dependent on the number of units tested.

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