MAX1717EVKIT

Evaluation Kit for the MAX1717


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Description

The MAX1717 evaluation kit (EV kit) demonstrates a high-power, dynamically adjustable notebook CPU application circuit. The MAX1717 DC-DC converter steps down high-voltage batteries and/or AC adapters, generating a precision, low-voltage CPU core VCC rail. The MAX1717 EV kit meets the Intel mobile Pentium® III CPU's transient voltage specification by using voltage positioning to minimize output capacitor requirements.

This fully assembled and tested circuit board provides a digitally adjustable 0.925V to 2V output voltage from a 7V to 24V battery input range. It delivers up to 12A output current with 14.1A peak current. The EV kit operates at 300kHz switching frequency and has superior line- and load-transient response. Output slew-rate control minimizes battery and inductor surge currents. With its precision timer circuit, the MAX1717's output voltage slew rate can be tailored to a given application, providing “just-in-time” arrival at the new DAC setting.

Key Features

  • High Speed, Accuracy, and Efficiency
  • Voltage-Positioned Output
  • Lowest Output Capacitor Count (4)
  • Reduces CPU Power Consumption
  • Fast-Response Quick-PWM™ Architecture
  • 7V to 24V Input Voltage Range
  • 0.925V to 2V Output Voltage Range
  • 12A Load-Current Capability (14.1A peak)
  • Controlled Input Surge Current During Output Transition
  • 300kHz Switching Frequency
  • No Current-Sense Resistor
  • VGATE Power-Good/Transition-Complete Indicator
  • 24-Pin QSOP Package
  • Low-Profile Components
  • Fully Assembled and Tested

Applications/Uses

  • 2-Cell to 4-Cell Li+ Battery to CPU Core Supply Converters
  • 5V to CPU Core Supply Converters
  • Notebook Computers with Intel SpeedStep® or Other Dynamically Adjustable Processors
Device   Fab Process   Technology   Sample size   Rejects   FIT at 25°C   FIT at 55°C   Material Composition  

Note : The failure rates are summarized by technology and mapped to the associated material part numbers. The failure rates are highly dependent on the number of units tested.

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