MAX1586AEVKIT

MAX1586A Evaluation Kit/Evaluation System


Please check latest availability status for a specific part variant.

Description

The MAX1586A evaluation kit (EV kit) is a fully assembled and tested surface-mount PCB that evaluates the MAX1586A power-management IC (PMIC). The IC is optimized for microprocessor-based applications. The MAX1586A integrates three high-performance synchronous step-down DC-DC power supplies, three low-dropout (LDO) regulators, a battery backup supply, and various power-management functions.

The MAX1586A evaluation system (EV system) consists of a MAX1586A evaluation kit (EV kit) and a companion Maxim CMAXQUSB board.

The Maxim SMBus™ interface board (CMAXQUSB) allows a PC to use its USB port to emulate an SMBus/I²C-compatible 2-wire interface. Windows® 98SE/2000/XP-compatible software provides a professional interface to exercise the features of the MAX1586A. The program is menu driven and offers a graphical user interface (GUI) with control buttons and a status display.

The MAX1586AEVCMAXQU includes both the EV kit and the CMAXQUSB interface board. Order the MAX1586A EV kit if you already have an SMBus interface.

Key Features

  • 2.6V to 5.5V Single-Supply Operation
  • Seven-Output Power Supply
    • 3.3V at 1.3A (VCC_I/O)
    • 2.5V at 900mA (VCC_MEM)
    • 0.7 to 1.475V at 500mA (VCC_CORE) Software Adjustable
    • 1.3V at 35mA (VCC_PLL)
    • 1.1V at 40mA (VCC_SRAM)
    • 0 to 3V at 35mA (VCC_USIM) Software Adjustable
    • Backup Battery Supply (30mA)
  • 1MHz Switching Frequency
  • On-Board Manual Reset Switch
  • Optional On-Board Power-Sequencing Circuitry
  • Power-OK Output
  • SMBus/I²C-Compatible 2-Wire Serial Interface
  • Easy-to-Use Menu-Driven Software
  • Software-Controlled Core and USIM Voltage Adjustment
  • Assembled and Tested
  • Include Windows 98SE/2000/XP-Compatible Software
  • Also Evaluate the MAX1586B
  • EV System Includes USB Connectivity

Applications/Uses

  • Internet Appliances and Web-Books
  • PDA, Palmtop, and Wireless Handhelds
  • Third-Generation Smart Cell Phones
Device   Fab Process   Technology   Sample size   Rejects   FIT at 25°C   FIT at 55°C   Material Composition  

Note : The failure rates are summarized by technology and mapped to the associated material part numbers. The failure rates are highly dependent on the number of units tested.

Quality Management System >
Environmental Management System >

 
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