MAX1540EVKIT

Evaluation Kit for the MAX1540


Please check latest availability status for a specific part variant.

Description

The MAX1540 evaluation kit (EV kit) demonstrates the standard 5A application circuit of the MAX1540. This DC-DC converter steps down high-voltage batteries and/or AC adapters, generating precision low-voltage chipset, dynamic random access memory (DRAM), and input/output (I/O) power supplies for notebook computers.

The MAX1540 EV kit provides a fixed 1.8V output voltage (OUT1), a fixed 2.5V output voltage (OUT2), and a fixed 5V, 100mA linear regulator (LDOOUT) from the 7V to 24V battery input range. It delivers up to 5A output current for each output voltage with greater than 90% efficiency. The EV kit operates at 355kHz/485kHz switching frequency (OUT2/OUT1, respectively) and has superior line- and load-transient response.

This EV kit is a fully assembled and tested circuit board. It also allows the evaluation of other output voltages in the 0.7V to 5.5V range by changing resistors R21 and R22 for OUT1, and resistors R19 and R20 for OUT2.

Key Features

  • 7V to 24V Input Voltage Range
  • Fixed 2.5V and 1.8V Output Voltages (Adjustable from 0.7V to 5.5V)
  • Fixed 5V/100mA Linear Regulator
  • 5A Output Current for Each Output
  • 355kHz (OUT2) and 485kHz (OUT1) Switching Frequency
  • Selectable Inductor Saturation Protection
  • Separate Power-Good Outputs
  • Selectable Overvoltage/Undervoltage Protection
  • Low-Profile Components
  • Fully Assembled and Tested
  • Applications/Uses

    • 0.7V to 5.5V Supply Rails
    • Active Termination Buses (MAX1541)
    • Core/IO Supplies as Low as 0.7V
    • CPU/Chipset/GPU with Dynamic Voltage Cores
    • DDR Memory Termination (MAX1541)
    • Notebook Computers
    • Supplies (MAX1541)
    Device   Fab Process   Technology   Sample size   Rejects   FIT at 25°C   FIT at 55°C   Material Composition  

    Note : The failure rates are summarized by technology and mapped to the associated material part numbers. The failure rates are highly dependent on the number of units tested.

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