MAX6394

High-Accuracy µP Reset Circuit

µP Supervisor Provides the Highest Accuracy at 1%


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Description

The MAX6394 low-power CMOS microprocessor (µP) supervisory circuit is designed to monitor power supplies in µP and digital systems. It offers excellent circuit reliability by providing 1% accurate thresholds over temperature and by eliminating external components and adjustments. The MAX6394 also provides a debounced manual reset input.

This device performs a single function: it asserts a reset signal whenever the VCC supply voltage falls below a preset threshold or whenever manual reset is asserted. Active-low RESET remains asserted for an internally programmed interval (reset timeout period) after VCC has risen above the reset threshold or manual reset is deasserted. The MAX6394's open-drain active-low RESET output can be pulled up to a voltage higher than VCC.

The MAX6394 comes with factory-trimmed reset threshold voltages from 2.4V to 4.8V. Preset timeout periods of 0.7ms, 14ms, 105ms, and 826ms are also available. The device comes in a SOT143 package.
MAX6394: Typical Operating Circuit MAX6394: Typical Operating Circuit Enlarge+

Key Features

  • ±0.6% Threshold Accuracy at TA = +25°C
  • ±1.0% Threshold Accuracy from -40°C to +125°C
  • Small SOT143 Package
  • Open-Drain Active-Low RESET Output Can Exceed VCC
  • Precision, Factory-Set VCC Reset Thresholds: Nine Options from 2.4V to 4.8V
  • Four Reset Timeout Periods Available: 0.7ms, 14ms, 105ms, and 826ms (minimum)
  • Immune to Short VCC Transients
  • 5µA Supply Current
  • AEC-Q100 Qualified, Refer to Ordering Information for Specific /V Part

Applications/Uses

  • Computers
  • Controllers
  • Critical µP and µC Power Monitoring
  • Intelligent Instruments
  • Portable/Battery-Powered Equipment
Product Reliability Reports: MAX6394.pdf 
Device   Fab Process   Technology   Sample size   Rejects   FIT at 25°C   FIT at 55°C   Material Composition  

Note : The failure rates are summarized by technology and mapped to the associated material part numbers. The failure rates are highly dependent on the number of units tested.

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