MAX16048

12-/8-Channel EEPROM-Programmable System Managers with Nonvolatile Fault Registers

Most Integrated, 12-/8-Channel System-Management ICs with NV Fault Monitoring


Please check latest availability status for a specific part variant.

Description

The MAX16046/MAX16048 EEPROM-configurable system managers monitor, sequence, track, and margin multiple system voltages. The MAX16046 manages up to twelve system voltages simultaneously, and the MAX16048 manages up to eight supply voltages. These devices integrate an analog-to-digital converter (ADC) for monitoring supply voltages, digital-to-analog converters (DAC) for adjusting supply voltages, and configurable outputs for sequencing and tracking supplies (during power-up and power-down). Nonvolatile EEPROM registers are configurable for storing upper and lower voltage limits, setting timing and sequencing requirements, and for storing critical fault data for readback following failures.

An internal 1% accurate 10-bit ADC measures each input and compares the result to one upper, one lower, and one selectable upper or lower limit. A fault signal asserts when a monitored voltage falls outside the set limits. Up to three independent fault output signals are configurable to assert under various fault conditions.

The integrated sequencer/tracker allows precise control over the power-up and power-down order of up to twelve (MAX16046) or up to eight (MAX16048) power supplies. Four channels (EN_OUT1–EN_OUT4) support closed-loop tracking using external series MOSFETs. Six outputs (EN_OUT1–EN_OUT6) are configurable with charge-pump outputs to directly drive MOSFETs without closed-loop tracking.

The MAX16046/MAX16048 include twelve/eight integrated 8-bit DAC outputs for margining power supplies when connected to the trim input of a point-of-load (POL) module.

The MAX16046/MAX16048 include six programmable general-purpose inputs/outputs (GPIOs). GPIOs are EEPROM configurable as dedicated fault outputs, as a watchdog input or output (WDI/WDO), as a manual reset (active-low MR), or for margin control inputs.

The MAX16046/MAX16048 feature two methods of fault management for recording information during system shutdown events. The fault logger records a failure in the internal EEPROM and sets a lock bit protecting the stored fault data from accidental erasure.

An I²C or a JTAG serial interface configures the MAX16046/MAX16048. These devices are offered in a 56-pin 8mm x 8mm TQFN package or a 64-pin 10mm x 10mm TQFP package and are fully specified from -40°C to +85°C.
MAX16046, MAX16048: Typical Operating Circuit MAX16046, MAX16048: Typical Operating Circuit Enlarge+

Key Features

  • Operates from 3V to 14V
  • 1% Accurate 10-Bit ADC Monitors 12/8 Inputs
  • 12/8 Monitored Inputs with 1 Overvoltage/1 Undervoltage/1 Selectable Limit
  • 12/8 8-Bit DAC Outputs for Margining or Voltage Adjustments
  • Nonvolatile Fault Event Logger
  • Power-Up and Power-Down Sequencing Capability
  • 12/8 Outputs for Sequencing/Power-Good Indicators
  • Closed-Loop Tracking for Up to Four Channels
  • Two Programmable Fault Outputs and One Reset Output
  • Six General-Purpose Input/Outputs Configurable as:
    • Dedicated Fault Output
    • Watchdog Timer Function
    • Manual Reset
    • Margin Enable Input
  • I²C (with Timeout) and JTAG Interface
  • EEPROM-Configurable Time Delays, Thresholds, and DAC Outputs
  • 100 Bytes of Internal User EEPROM
  • -40°C to +85°C Operating Temperature Range

Applications/Uses

  • Networking/Telecom
  • Servers
  • Storage Systems
  • Workstations

MAX16046EVKIT: Evaluation Kit for the MAX16046

Technical Documents

App Note 4285 In-Circuit Programming for the MAX16046–MAX16049 EEPROM-Programmable System Managers

Quality and Environmental Data

Request Reliability Report for: MAX16048 
Lead-Free Package Tin (Sn) Whisker Reports
Device   Fab Process   Technology   Sample size   Rejects   FIT at 25°C   FIT at 55°C  

Note : The failure rates are summarized by technology and mapped to the associated material part numbers. The failure rates are highly dependent on the number of units tested.

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