DS1816

3.3V EconoReset with Open Drain Output


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Description

The DS1811 (5V) and DS1816 (3.3V) EconoResets are simple three-pin voltage monitors and power-on resets that hold reset for 150ms for stabilization after power returns to tolerance. The voltage monitor uses precision temperature reference and comparator circuits that detect out-of-tolerance conditions and generate an active low reset.

The open-drain output has an internal 5.5kΩ pull-up resistor for use in a wired-AND circuit.

EconoResets replace discrete components and save space, particularly in the new SOT-23 package. They can benefit any system that requires reliable processor operation, especially consumer products like printers, HVAC, energy management, cellular telephones, PDAs, and set-top boxes.
DS1816: Block Diagram DS1816: Block Diagram Enlarge+

Key Features

  • Voltage monitor for power-fail detection
  • Active low reset
  • 150ms pause for stabilization
  • Efficient open-drain output with internal 5.5kΩ pull-up resistor
  • Maximum quiescent current of 35µA
  • Operating ranges:
    • 3.3V with 5%, 10% or 20% tolerance
    • -40°C to +85°C

See parametric specs for Supervisors (1 Monitored Voltage) (252)


Part NumberReset Thresh.
(V)
Reset OuttRESETWatchdog FeatureReset Thresh. Accur.
(%)
ICC
(µA)
Package/PinsBudgetary
Price
min@ +25°CmaxSee Notes
DS1816 2.5 to 3.3
Active Low
Open Drain
85ms to 300msNo Watchdog2.535
SOT23/3
TO92/3
$1.22 @1k

Pricing Notes:
This pricing is BUDGETARY, for comparing similar parts. Prices are in U.S. dollars and subject to change. Quantity pricing may vary substantially and international prices may differ due to local duties, taxes, fees, and exchange rates. For volume-specific and version-specific prices and delivery, please see the price and availability page or contact an authorized distributor.
Product Reliability Reports: DS1816.pdf 
Device   Fab Process   Technology   Sample size   Rejects   FIT at 25°C   FIT at 55°C   Material Composition  

Note : The failure rates are summarized by technology and mapped to the associated material part numbers. The failure rates are highly dependent on the number of units tested.

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