MAX20326

Dual Precision Bus Accelerator

Dual-Channel, High-Precision, Open-Drain, Communication-Line Accelerator


Please check latest availability status for a specific part variant.

Description

The MAX20326 is a dual-channel, precision, open-drain, communication-line accelerator. It provides the acceleration from a low-to-high transition necessary to allow faster data transfer in a highly capacitive, multidrop node system.

The MAX20326 is optimized for the I2C bus, as well as 1-Wire® bus, where a high-speed, open-drain operation is often required with a highly capacitive load.

This device is available in a 4-pin 0.5mm pitch 1.25mm x 1.25mm flip-chip QFN package and operates over the -40°C to +85°C extended temperature range.
MAX20326: Typical Operating Circuit MAX20326: Typical Operating Circuit Enlarge+

Key Features

  • Reliable Communication
    • Wide Operating Input Voltage: +1.4V to +5.5V
    • Precision Accelerator Trigger Threshold: 0.5V ±50mV
    • Fast Charge up to 1000pF Load
    • Low EMI: Controlled Acceleration Slope
  • Space Saving
    • 4-Pin 0.5mm Pitch 1.25mm x 1.25mm Flip-Chip QFN
    • Integrated Precision Pullup
Part NumberChannelsVIN
(V)
VIN
(V)
Oper. Temp.
(°C)
Package/PinsBudgetary
Price
minmaxSee Notes
MAX20326 NEW!21.45.5-40 to +85
FC2QFN/4
$0.41 @1k
See All Overvoltage Protection Controllers (84)
Pricing Notes:
This pricing is BUDGETARY, for comparing similar parts. Prices are in U.S. dollars and subject to change. Quantity pricing may vary substantially and international prices may differ due to local duties, taxes, fees, and exchange rates. For volume-specific and version-specific prices and delivery, please see the price and availability page or contact an authorized distributor.


MAX20326EVKIT: Evaluation Kit for the MAX20326

Quality and Environmental Data

Request Reliability Report for: MAX20326 
Lead-Free Package Tin (Sn) Whisker Reports
Device   Fab Process   Technology   Sample size   Rejects   FIT at 25°C   FIT at 55°C  

Note : The failure rates are summarized by technology and mapped to the associated material part numbers. The failure rates are highly dependent on the number of units tested.

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