2.7V to 18V, 12A, Hot-Swap Solution with Current Report Output

Smallest and Most Integrated Hot Swap for 12V Applications

Please check latest availability status for a specific part variant.


The MAX15090B/MAX15090C ICs are integrated solutions for hot-swap applications requiring the safe insertion and removal of circuit line cards from a live backplane. The devices integrate a hot-swap controller, 6mΩ power MOSFET, and an electronic circuit-breaker protection in a single package.

The devices integrate an accurate current-sense circuitry and provide 220µA/A of proportional output current. The devices are designed for protection of 2.7V to 18V supply voltages.

These devices implement a foldback current limit during startup to control inrush current lowering di/dt and keep the MOSFET operating under safe operating area (SOA) conditions. After the startup cycle is complete, on-chip comparators provide VariableSpeed/BiLevel™ protection against short-circuit and overcurrent faults, and immunity against system noise and load transients. The load is disconnected in the event of a fault condition. The devices are factory calibrated to deliver accurate overcurrent protection with ±10% accuracy. During a fault condition, the MAX15090B latches off, while the MAX15090C enters autoretry mode.

The devices feature an IN-to-OUT short-circuit detection before startup. The devices provide a power-MOSFET GATE pin to program the slew rate during startup by adding an external capacitor. The devices have overvoltage/undervoltage input pins that can detect an overvoltage/undervoltage fault and disconnect the IN from the OUT. Additional features include internal overtemperature protection, power-good output, and fault-indicator output.

The MAX15090B/MAX15090C ICs are available in a 28-bump, 2.07mm x 3.53mm, power wafer-level package (WLP) and are rated over the -40°C to +85°C extended temperature range.
MAX15090B, MAX15090C: Functional Diagram MAX15090B, MAX15090C: Functional Diagram Enlarge+

Key Features

  • Integration Reduces Solution Size for Blade Servers and Other Space-Constrained Designs
    • Integrated 6mΩ (typ) Internal Power MOSFET Overvoltage Protection
    • Power-Good and Fault Outputs
    • Programmable Undervoltage Lockout
    • Current Reporting Without Need for External RSENSE
    • Thermal Protection
  • Flexibility Enables Use in Many Unique Designs
    • 2.7V to 18V Operating Voltage Range
    • Adjustable Circuit-Breaker Current/Current-Limit Threshold
    • Programmable Slew-Rate Control
    • Variable-Speed Circuit-Breaker Response
    • Latchoff or Automatic Retry Options
  • Safety Features Ensure Accurate, Robust Protection
    • 12A (max) Load Current Capability
    • ±10% Circuit-Breaker Threshold Accuracy
    • Inrush Current Regulated at Startup with Foldback
    • Implementation for di/dt Control
    • IN-to-OUT Short-Circuit Detection


  • Disk Drive Power
  • Industrial
  • RAID Systems
  • Server I/O Cards
  • Storage Bridge Bay
Part NumberChannelsVIN
Internal Pwr. MOSFETsRON
Current Limit
Current Limit
Current Limit Accuracy
Fault ResponseOper. Temp.
minmaxtypminmaxSee Notes
MAX15090B 12.718NMOS631210Latchoff-40 to +85
$5.13 @1k
MAX15090C Auto Retry
$3.10 @1k
See All Overvoltage/Overcurrent Protectors with Internal MOSFETs (26)
Pricing Notes:
This pricing is BUDGETARY, for comparing similar parts. Prices are in U.S. dollars and subject to change. Quantity pricing may vary substantially and international prices may differ due to local duties, taxes, fees, and exchange rates. For volume-specific and version-specific prices and delivery, please see the price and availability page or contact an authorized distributor.

MAX15090BEVKIT: Evaluation Kit for the MAX15090B/MAX15090C
MAX15090CEVKIT: Evaluation Kit for the MAX15090B/MAX15090C

CAD Symbols and Footprints

  • MAX15090BEWI+
  • MAX15090BEWI+T
  • Device   Fab Process   Technology   Sample size   Rejects   FIT at 25°C   FIT at 55°C  

    Note : The failure rates are summarized by technology and mapped to the associated material part numbers. The failure rates are highly dependent on the number of units tested.

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