High-Current VCOM Drive Buffers for TFT LCDs

High Current and Fast Settling Time to Quickly Restore VCOM Voltage for TFT LCDs

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The MAX9550/MAX9551/MAX9552 provide a VCOM source for TFT LCDs. The MAX9550/MAX9551/MAX9552 source and sink a large current to quickly restore the VCOM voltage, making it ideal for TFT LCDs. The output settles to within 0.1% in less than 2µs. In addition, the MAX9550/MAX9551/MAX9552 directly drive the capacitive load in the VCOM layer of the TFT LCDs without the need for a series resistor.

The MAX9550/MAX9551/MAX9552 feature single, dual, and quad channel VCOM amplifiers, respectively. The MAX9550/MAX9551/MAX9552 can drive up to 800mA of peak current per channel and operate up to 20V. The devices feature soft-start to reduce inrush current, output short-circuit protection, and thermal shutdown.

The MAX9550 is available in a space-saving 5-pin thin SOT23 package, and an 8-pin µMAX® package with an exposed paddle. The MAX9551 is available in an 8-pin µMAX package with an exposed paddle. The MAX9552 is available in a 14-pin TSSOP package. All devices are specified over the -40°C to +85°C temperature range.
MAX9550, MAX9551, MAX9552: Typical Operating Circuit MAX9550, MAX9551, MAX9552: Typical Operating Circuit Enlarge+

Key Features

  • Operates Up to 20V
  • 800mA Peak Output Current
  • Settles to Within 0.1% of VOUT in Less than 2µs
  • Excellent Load Regulation
  • Thermal-Shutdown Protection
  • Short-Circuit Protection to Both Rails
  • Soft-Start to Reduce Inrush Current


  • Displays: LCD
  • Flat-Panel and Plasma TVs
  • Instrument Control Voltage Sources
  • TFT LCD Panels

Quality and Environmental Data

Request Reliability Report for: MAX9550 
Lead-Free Package Tin (Sn) Whisker Reports

Tools & Models

  • MAX9550 PSPICE Macromodel
  • CAD Symbols and Footprints

  • MAX9550EUA+
  • MAX9550EUA+T
  • MAX9550EZK+
  • MAX9550EZK+T
  • Device   Fab Process   Technology   Sample size   Rejects   FIT at 25°C   FIT at 55°C  

    Note : The failure rates are summarized by technology and mapped to the associated material part numbers. The failure rates are highly dependent on the number of units tested.

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