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The MAX7219/MAX7221 are compact, serial input/output common-cathode display drivers that interface microprocessors (µPs) to 7-segment numeric LED displays of up to 8 digits, bar-graph displays, or 64 individual LEDs. Included on-chip are a BCD code-B decoder, multiplex scan circuitry, segment and digit drivers, and an 8x8 static RAM that stores each digit. Only one external resistor is required to set the segment current for all LEDs. The MAX7221 is compatible with SPI™, QSPI™, and MICROWIRE™, and has slew-rate-limited segment drivers to reduce EMI.
A convenient 4-wire serial interface connects to all common µPs. Individual digits may be addressed and updated without rewriting the entire display. The MAX7219/MAX7221 also allow the user to select code-B decoding or no-decode for each digit.
The devices include a 150µA low-power shutdown mode, analog and digital brightness control, a scan-limit register that allows the user to display from 1 to 8 digits, and a test mode that forces all LEDs on.
For applications requiring 3V operation or segment blinking, refer to the MAX6951 data sheet.
Part Number | LCD or LED | Digits or Char. | Output Format | Display Type | Interface | Fonts | VSUPPLY (V) | VSUPPLY (V) | Package/Pins | Budgetary Price | ||||||
min | max | See Notes | ||||||||||||||
MAX7219 | LED | 8-Digit | 7 segment + DP | Common Cathode | Serial 3-Wire 10Mbit | Code B | 4 | 5.5 |
| $5.38 @1k | ||||||
MAX7221 | Serial SPI 10Mbit |
| $5.54 @1k | |||||||||||||
See All Display Drivers (47) | ||||||||||||||||
Pricing Notes: This pricing is BUDGETARY, for comparing similar parts. Prices are in U.S. dollars and subject to change. Quantity pricing may vary substantially and international prices may differ due to local duties, taxes, fees, and exchange rates. For volume-specific and version-specific prices and delivery, please see the price and availability page or contact an authorized distributor. |
Device | Fab Process | Technology | Sample size | Rejects | FIT at 25°C | FIT at 55°C |
Note : The failure rates are summarized by technology and mapped to the associated material part numbers. The failure rates are highly dependent on the number of units tested.
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