MAX20067EVKIT

Evaluation Kit for the MAX20067


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Description

The MAX20067 evaluation kit (EV kit) is a fully assembled and tested surface-mount PCB that provides the voltages and features required for automotive thin-film transistor (TFT), liquid-crystal display (LCD) applications. The EV kit includes a synchronous boost converter, double-stage positive charge pump, double-stage negative charge pump, VCOM buffer, and gate-shading push-pull switch. The EV kit can operate from 2.7V to 5.5V input voltages and is optimized for automotive TFT-LCD applications. The EV kit can be configured to operate in stand-alone mode or in I2C mode. The boost converter is configured for a 12V output that provides at least 200mA. The positive-gate voltage regulator provides 16V output and the negative-gate voltage regulator provides -6V. The VCOM buffer provides an I2C-adjustable output voltage initially biased at 6V.

The EV kit provides an I2C interface that can operate in conjunction with the MINIQUSB+ adapter board or a third-party I2C master, such as a general-purpose microcontroller. The EV kit also includes Windows®-compatible software that provides a simple graphical user interface (GUI) for exercising the features of the IC. The EV system includes both the EV kit and the MINIQUSB+ adapter board.

Key Features

  • 2.7V to 5.5V Input Range
  • Default Output Voltage
    • 12V Output at 200mA, (Boost Converter)
    • 16V Output at 10mA (Positive-Gate Voltage Regulator)
    • -6V Output at 3mA (Negative-Gate Voltage Regulator)
    • 6V Output at 130mA (VCOM Buffer)
  • Selectable Switching Frequency (2.2MHz or 400kHz) with Spread-Spectrum Option
  • Double-Stage Positive- and Negative-Regulated Charge Pumps
  • Gate Shading Enabled
  • Full Sequencing Flexibility
  • I2C Programmability
  • Dedicated GUI
  • C Driver Available
  • Proven PCB Layout
  • Fully Assembled and Tested

Applications/Uses

  • Central Information Displays
  • Infotainment Displays
  • Instrument Clusters

Quality and Environmental Data

Lead-Free Package Tin (Sn) Whisker Reports
Device   Fab Process   Technology   Sample size   Rejects   FIT at 25°C   FIT at 55°C  

Note : The failure rates are summarized by technology and mapped to the associated material part numbers. The failure rates are highly dependent on the number of units tested.

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