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MAX1995EVSYS

MAX1995EVSYS

Evaluation Systems for the MAX1895, MAX1995

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Overview

Description

The MAX1895 evaluation systems are assembled and tested PC boards that demonstrate the MAX1895 high-efficiency, wide brightness range CCFL backlight controller. The MAX1895EVSYS-S is designed for single-lamp applications and the MAX1895EVSYS-D is designed for dual-lamp applications. Both systems can control the brightness of the lamps through either the SMBus interface or by an on-board potentiometer.

The systems include a Maxim SMBus™ interface board (MAXSMBus), which allows an IBM®-compatible PC to use its parallel port to emulate an Intel® system management bus (SMBus) I²C; interface. Windows® 95/98-compatible software provides a user-friendly interface to exercise the features of the MAX1895. The program is menu-driven and offers a graphic interface with control buttons and status display.

Note: Windows NT/2000 requires additional driver software; contact the factory.

To evaluate the performance of the MAX1995, configure the MAX1895EVSYS for analog interface mode. There is no need to change the IC since the MAX1895's performance is identical to the MAX1995's performance.

Key Features

  • Single Lamp Application (MAX1895EVSYS-S) Dual Lamp Application (MAX1895EVSYS-D)
  • 7V to 24V Input Range
  • Wide Brightness Adjustment Range
  • Open Lamp Protection with 2s Timeout
  • Brightness Adjustable through SMBus Interface or On-Board Potentiometer
  • No Flicker at Low Brightness
  • High Power-to-Light Efficiency
  • I²C/SMBus Compatible
  • Easy to Use Menu-Driven Software
  • Assembled and Tested
  • Includes: Windows 95/98-Compatible Software (3.5in Floppy Disk) and Demo PC Board

    • Applications/Uses

    • Car-Navigation Displays
    • LCD Monitors
    • Notebook Computers
    • Point-of-Sale Terminals
    • Portable Display Electronics

    Design Resources

    Additional Resources

    MAXSMBus

    Quality And Environmental

    Request Reliability Report for: MAX1995EVSYS 
    Device   Fab Process   Technology   Sample size   Rejects   FIT at 25°C   FIT at 55°C   Material Composition  

    Note : The failure rates are summarized by technology and mapped to the associated material part numbers. The failure rates are highly dependent on the number of units tested.

    Quality Management System >
    Environmental Management System >

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