MAXQ610

16-Bit Microcontroller with Infrared Module

Increases Battery Life with Lower Power (200nA stop, 3.75mA at 12MHz) and a Wide Operating Range (1.7V to 3.6V)


Please check latest availability status for a specific part variant.

Description

The MAXQ610 is a low-power, 16-bit MAXQ® microcontroller designed for low-power applications including universal remote controls, consumer electronics, and white goods. The MAXQ610 combines a powerful 16-bit RISC microcontroller and integrated peripherals including two USARTs and an SPI™ master/slave communications port, along with an IR module with carrier frequency generation and flexible port I/O capable of multiplexed keypad control.

The MAXQ610 includes 64KB of flash memory and 2KB of data SRAM. Intellectual property (IP) protection is provided by a secure MMU that supports multiple application privilege levels and protects code against copying and reverse engineering. Privilege levels enable vendors to provide libraries and applications to execute on the MAXQ610, while limiting access to only data and code allowed by their privilege level.

For the ultimate in low-power battery-operated performance, the MAXQ610 includes an ultra-low-power stop mode (0.2µA, typ). In this mode, the minimum amount of circuitry is powered. Wake-up sources include external interrupts, the power-fail interrupt, and a timer interrupt. The microcontroller runs from a wide 1.70V to 3.6V operating voltage.

Note: Designers must have the following documents to fully use all the features of this device. This data sheet contains pin descriptions, feature overviews, and electrical specifications. Errata sheets contain deviations from published specifications. The user's guides offer detailed information about device features and operation.
MAXQ610: Pin Configurations MAXQ610: Pin Configurations Enlarge+

Key Features

  • Dedicated Pointer for Direct Read from Code Space
  • 16-Bit Instruction Word, 16-Bit Data Bus
  • 16 x 16-Bit General-Purpose Working Registers
  • Secure MMU for Application Partitioning and IP Protection
  • Memory Features
    • 64KB Flash:
      • 512 Byte Sectors
      • 20,000 Erase/Write Cycles per Sector
    • Masked ROM Available
    • 2KB Data SRAM
  • Additional Peripherals
    • Power-Fail Warning
    • Power-On Reset/Brownout Reset
    • Automatic IR Carrier Frequency Generation and Modulation
    • Two 16-Bit, Programmable Timers/Counters with Prescaler and Capture/Compare
    • SPI and Two USART Communication Ports
    • Programmable Watchdog Timer
    • 8kHz Nanopower Ring Oscillator Wake-Up Timer
    • Up to 24 (MAXQ610A) or 32 (MAXQ610B) General-Purpose I/Os
  • Low-Power Consumption
    • 0.2µA (typ), 2.0µA (max) in Stop Mode TA = +25°C, Power-Fail Monitor Disabled
    • 3.75mA (typ) at 12MHz in Active Mode

Applications/Uses

  • Battery-Powered Portable Equipment
  • Consumer Electronics
  • Home Appliances
  • Remote Controls
  • White Goods
Part NumberMCU CoreCore Clock Speed
(MHz)
Data ProcessingInternal Flash
(KBytes)
Internal SRAM
(KBytes)
USARTsSPI BusGPIO PinsPWMTimer FeaturesPackage/PinsBudgetary
Price
maxmaxSee Notes
MAXQ610 MAXQ20S1216-bit64221322
Wake Up Timer
Watchdog
DICE SALES
LQFP/32
TQFN/32
TQFN/40
TQFN/44
TQFP/44
$1.44 @1k
See All Microcontrollers (55)
Pricing Notes:
This pricing is BUDGETARY, for comparing similar parts. Prices are in U.S. dollars and subject to change. Quantity pricing may vary substantially and international prices may differ due to local duties, taxes, fees, and exchange rates. For volume-specific and version-specific prices and delivery, please see the price and availability page or contact an authorized distributor.


MAXQ610-KIT: Evaluation Kit for the MAXQ610

CAD Symbols and Footprints

  • MAXQ610A-0000+
  • MAXQ610B-0000+
  • MAXQ610E-UEI+
  • MAXQ610J-0000+
  • MAXQ610J-0000+T
  • MAXQ610J-2903+T
  • Device   Fab Process   Technology   Sample size   Rejects   FIT at 25°C   FIT at 55°C  

    Note : The failure rates are summarized by technology and mapped to the associated material part numbers. The failure rates are highly dependent on the number of units tested.

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