MAXQ2010-KIT

Evaluation Kit for the MAXQ2010

Ideal Microcontroller If You Need High Performance (16-Bit RISC Core) Coupled with Low Power (2.7V)


Please check latest availability status for a specific part variant.

Description

The MAXQ2010 evaluation kit (EV kit) is a proven platform to conveniently evaluate the capabilities of the MAXQ2010 ADC microcontroller. The kit contains the MAXQ2010 with unused GPIO pins brought out to headers, a USB-to-JTAG programming interface, on-board power regulators, buffered ADC inputs, and an 8-digit LCD display. With the included software, and USB cable connected to a personal computer, the EV kit provides a completely functional system ideal for evaluating the capabilities of the MAXQ2010.

Key Features

  • Easily Load Code and Debug Using On-Board USB Interface
  • USB-to-JTAG Interface Provides In-Application Debugging Features
    • Step-by-Step Execution Tracing
    • Breakpointing by Code Address, Data Memory Address, or Register Access
    • Data Memory View and Edit
  • 8-Digit, 14-Segment, x4 Multiplexed LCD Display Driven Directly by MAXQ2010
  • On-Board 3.3V and 2.5V Linear Regulators
  • EV Kit Board Can Be Powered from USB Interface, JTAG Interface, or DC Power Supply
  • 5-Way (Up, Down, Left, Right, and Push to Select) Navigation Switch
  • Pushbuttons for Reset and Interrupt Lines
  • Level-Shifted RS-232 Interface Included for Serial Port 1
  • Test/Expansion Headers Include All Unused Device GPIO Pins
  • Included Board Schematics Provide a Convenient Reference Design

Applications/Uses

  • Battery-Powered and Portable Devices
  • Consumer Electronics
  • Data-Acquisition Systems and Data Loggers
  • Electrochemical and Optical Sensors
  • Gas and Chemical Sensors
  • Home Appliances
  • HVAC
  • Industrial Control
  • Medical Instrumentation
  • Portable Medical Equipment
  • Security Sensors
  • Smart Transmitters
  • Thermostats/Humidity Sensors

Technical Documents

App Note 4716 How to Build a Simple, Interactive Digital Voltmeter
Request Reliability Report for: MAXQ2010-KIT 
Device   Fab Process   Technology   Sample size   Rejects   FIT at 25°C   FIT at 55°C   Material Composition  

Note : The failure rates are summarized by technology and mapped to the associated material part numbers. The failure rates are highly dependent on the number of units tested.

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