MAX32570-MNKIT

Evaluation Kit for the MAX32570


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Description

The MAX32570 evaluation kit (EV kit) provides a platform for leveraging the capabilities of the MAX32570 to build new generations of trusted devices.

The EV kit features a socketed MAX32570. Included hardware supports ethernet, smart cards, camera modules and an onboard 3.5in touch-enabled color TFT display. Uncommitted GPIO is readily accessible through 0.1in pin headers. UART access is provided by dual USB bridges with independent USB Micro B connectors. Primary system power is sourced from the MAX32570 USB connector. The system can also be powered from either of the UART USB connectors.

Key Features

  • Arm® Cortex®-M4 Processor with FPU Up to 150MHz
  • Two Independent USB 2.0 Micro B to Serial UART Bridges
  • Six Dynamic Pattern Security Self-Destruct I/O Signals Available Through a 0.1in Header
  • Arm Cortex or SWD JTAG 10-Pin Header
  • 64MB QSPI XIP Flash
  • 1MB QSPI XIP RAM
  • Select GPIOs Accessible Through 0.1in Headers
  • ADC Input with Optional AA Filter
  • Touch Enabled 3.5in 320 x 240 Color TFT Display
  • 10/100 Ethernet Transceiver with RJ45 Connector
  • Smart Card Socket with Support for Legacy 5V Cards
  • System Power Can Be Provided Through Any USB Connection
  • Charge Controller on USB/PWR Port Supports Charging an Optional LiPo Cell
  • All IC Power Rails Can Be Isolated by Jumpers for Individual Current Measurements
  • General-Purpose LED and General-Purpose Pushbutton Switch

Applications/Uses

  • ATM Keyboards
  • Contact/Contactless Pinpads
  • Countertop and Tablet POS
  • PCI Mobile Payment Terminals (mPOS)
  • Secure Card Reader for PIN (SCRP)

Quality and Environmental Data

Request Reliability Report for: MAX32570-MNKIT 
Lead-Free Package Tin (Sn) Whisker Reports
Device   Fab Process   Technology   Sample size   Rejects   FIT at 25°C   FIT at 55°C  

Note : The failure rates are summarized by technology and mapped to the associated material part numbers. The failure rates are highly dependent on the number of units tested.

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