Evaluation Kit for for DeepCover Secure Cortex-M3 Flash Microcontroller MAX32555

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The DeepCover® Secure Cortex®-M3 Flash Microcontroller evaluation kit (EV kit) provides a proven platform for conveniently evaluating the capabilities of the MAX32555 high-security microcontroller. The EV kit includes a MAX32555 EV kit board, example software, documentation, and a SEGGER J-Link LTE JTAG. The EV kit board includes SIM and SAM smart card sockets, a 3-track magnetic card reader (MCR), OLED mono color display, pin headers providing access to the processor’s I/O port pins, push-button keypad matrix, two DB9 female serial connectors, and a Micro-USB type-B connector. The EV kit provides a complete, functional system ideal for developing and debugging applications as well as evaluating the overall capabilities of the MAX32555 microcontroller.

Key Features

  • Easily Load and Debug Code Using Supplied JTAG Adapter
  • JTAG Interface Provides In-Application Debugging Features
    • Step-by-Step Execution Tracing
    • Breakpointing by Code Address, Data Memory Address, or Register Access
    • Data Memory or Register Content View and Edit
  • On-Board 3.3V and 5.25V Voltage Regulators
  • ON/OFF Switch
  • Two Smart Card Sockets (One Full-Size Socket and One SIM Socket) for Prototyping IC Card Applications
  • All the GPIOs Ports Are Accessible via 0.1in Headers
  • 3-Track Magnetic Card Reader
  • Level-Shifted RS-232 Transceiver (MAX3232) Included for Serial Port
  • User-Input Pushbutton Switches, 4x4 Keypad Matrix, and Indicator LEDs (Connected to GPIO)
  • Self-Destruct Inputs Available on Headers for Connecting to External Trigger Circuits
  • On-Board Battery for Memory Backup and Real-Time Clock Operation
  • Micro-USB Type-B Connector


  • ATM Keyboards
  • EMV Card Reader
  • PCI Mobile Payment Terminals (mPOS)

Quality and Environmental Data

Request Reliability Report for: MAX32555-KIT 
Lead-Free Package Tin (Sn) Whisker Reports
Device   Fab Process   Technology   Sample size   Rejects   FIT at 25°C   FIT at 55°C  

Note : The failure rates are summarized by technology and mapped to the associated material part numbers. The failure rates are highly dependent on the number of units tested.

Quality Management System >
Environmental Management System >


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