DS80C400-KIT

DS80C400 Evaluation Kit

Conveniently Evaluates the DS80C400 Networked Microcontroller


Please check latest availability status for a specific part variant.

Description

The data sheet for the DS80C400 evaluation kit is no longer available online. To receive a copy of this data sheet, please contact technical support.

The DS80C400 evaluation kit (EV kit) is a proven platform to conveniently evaluate the capabilities of the DS80C400 networked microcontroller. This kit contains the DSTINIm400 evaluation module, a fully functional and tested reference design based on the DS80C400 networked microcontroller. In addition, the kit contains the DSTINIs400 sockets board, which functions as the motherboard designed to host the DSTINIm400 evaluation module.

EVALUATION KIT CONTENTS
  • DSTINIm400* Reference Board
  • DSTINIs400* Socket Board
  • DS80C400 Software CD-ROM
  • Quick Start Guide
  • 9-Pin Serial Cable
  • Ethernet Cable

Key Features

  • Hosts the MxTNI™ Runtime Environment in a Validated Hardware Design (DSTINIm400)
  • 10/100 Ethernet Interface Connects Directly to Standard Networks
  • Three Hardware Serial Ports
  • One TTL Level Connectors
  • Two RS-232 Level Connectors
  • Integrated 1-Wire® Network Master
  • Hardware CAN 2.0B Port
  • Software Support for I²C and SPI Ports
  • Real-Time Clock (RTC) for Time/Date Stamping of Critical Transactions
  • 1MB Flash ROM for Application Storage
  • 1MB NV SRAM for Data Storage
  • 5V Power Supply (Center Positive)

Applications/Uses

  • Analog Modems
  • Automatic Meter Reading/900MHz-ISM
  • Automatic Teller Machine Systems
  • Data Converters (Serial-to-Ethernet, CAN-to-Ethernet)
  • Environmental Monitoring
  • Home/Office Automation
  • Industrial Control and Automation
  • Network Sensors
  • Portable Point-of-Sales Equipment
  • Remote Data-Collection Equipment
  • Security Systems
  • Transaction/Payment Terminals
  • Vending

Quality and Environmental Data

Request Reliability Report for: DS80C400-KIT 
Lead-Free Package Tin (Sn) Whisker Reports
Device   Fab Process   Technology   Sample size   Rejects   FIT at 25°C   FIT at 55°C  

Note : The failure rates are summarized by technology and mapped to the associated material part numbers. The failure rates are highly dependent on the number of units tested.

Quality Management System >
Environmental Management System >

 
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