MAX3451E

±15kV ESD-Protected USB Transceivers

±15kV ESD-Protected USB Transceivers


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Description

The MAX3450E/MAX3451E/MAX3452E USB-compliant transceivers interface low-voltage ASICs with USB devices. The devices fully comply with USB 1.1 and USB 2.0 when operating at full (12Mbps) and low (1.5Mbps) speeds. The MAX3450E/MAX3451E/ MAX3452E operate with VL as low as +1.65V, ensuring compatibility with low-voltage ASICs.

The MAX3450E/MAX3451E/MAX3452E feature a logic-selectable suspend mode that reduces current consumption to less than 40µA. Integrated ±15kV ESD protection protects the USB D+ and D- bidirectional bus connections. The MAX3450E is pin compatible with Micrel's MIC2550A. The MAX3451E features an internal 1.5kΩ USB pullup resistor and an enumeration function that allows devices to logically disconnect while plugged in. The MAX3452E provides a push-pull bus-detect (BD) output that asserts high when VBUS is greater than +4.0V.

The MAX3450E/MAX3451E/MAX3452E operate over the -40°C to +85°C extended temperature range and are available in 14-pin TSSOP and 3mm x 3mm 16-pin thin QFN packages.

MAX3450E, MAX3451E, MAX3452E: Functional Diagram MAX3450E, MAX3451E, MAX3452E: Functional Diagram Enlarge+

Key Features

  • ±15kV ESD Protection on D+ and D-
  • Combined VP and VM Inputs/Outputs
  • +1.65V to +3.6V VL Logic Supply Input for Interfacing with Low-Voltage ASICs
  • Enumerate Input Function (MAX3451E)
  • Powered from Li+ Battery as Low as +3.1V (MAX3450E and MAX3451E)
  • VBUS Detection (MAX3452E)
  • Pin Compatible with Micrel MIC2550A (MAX3450E)
  • Internal D+ or D- Pullup Resistor (MAX3451E)
  • No Power-Supply Sequencing Required
  • Applications/Uses

    • Cell Phones
    • Data Cradles
    • MP3 Players
    • PC Peripherals
    • PDAs
    Product Reliability Reports: MAX3451E.pdf 
    Device   Fab Process   Technology   Sample size   Rejects   FIT at 25°C   FIT at 55°C   Material Composition  

    Note : The failure rates are summarized by technology and mapped to the associated material part numbers. The failure rates are highly dependent on the number of units tested.

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