Evaluation Kit for the MAX16972/MAX16972A

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The MAX16972A evaluation kit (EV kit) demonstrates the MAX16972 and MAX16972A automotive USB 2.0 protector ICs. The ICs support Hi-Speed, full-speed, and low-speed operation. In addition, the ICs also include integrated circuitry to enable fast charging for consumer devices adhering to the Apple® 1A dedicated charging mode, the USB-IF host-charger port-detection protocol, and the China YD/T 1591-2009 standard. Dedicated charging modes feature autodetection, which automatically selects the correct dedicated charging protocol for the connected portable device (PD). The IC part numbers with GEEB and GTEB suffixes also support independent control of the +5V bus per the USB-IF OTG specification, and add Apple 2.1A dedicated charging support.

Two EV kits are available: MAX16972AGTEVKIT# (TQFN version) and MAX16972AGEEVKIT# (QSOP version), which come with the MAX16972AGTEB/V+ and MAX16972AGEEB/V+ installed, respectively. These userfriendly EV kits can be connected directly to a USB host port, thanks to the on-board MAX15007A automotive regulator that provides the IN logic power supply. Contact the factory for free samples of the pin-compatible variants of the MAX16972/MAX16972A ICs, which offer additional dedicated charging-mode functionality and active-low enable logic.

Key Features

  • 900MHz Bandwidth USB 2.0 Data Switches
  • Integrated Dedicated-Charging and Host-Charger Port-Detection Circuitry
  • Supports Charging Current from 500mA to 3A
  • USB 2.0-Compliant LS/FS and HS Operation
  • Short-to-Battery, Short-to-Ground, and Overcorrect Protection on Protected HVBUS Output
  • Short-to-Battery and Short-to-HVBUS Protection on Protected HVD+ and HVD- Outputs
  • USB-Powered or User-Supplied Power Supplies
  • Proven PCB Layout
  • Fully Assembled and Tested


  • Automotive Connectivity
  • Automotive Radio and Navigation
  • Telematics
  • USB Hub
Device   Fab Process   Technology   Sample size   Rejects   FIT at 25°C   FIT at 55°C   Material Composition  

Note : The failure rates are summarized by technology and mapped to the associated material part numbers. The failure rates are highly dependent on the number of units tested.

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