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The MAX14600–MAX14605 and MAX14618 are third-generation USB 2.0 host charger identification devices that combine USB Hi-Speed analog switches with a USB adapter emulator circuit.
The devices support pass-through mode and auto mode. In charging downstream port (CDP) pass-through mode, the devices emulate the CDP function while supporting normal USB traffic. The MAX14600/MAX14603/MAX14605 have a pFET open-drain output (active-low CEN), and the MAX14601/MAX14604/MAX14618 have an nFET open-drain output (CEN) to restart the peripheral connected to the USB host.
All the devices support the CDP and standard downstream port (SDP) charging during the active state (S0) and support the dedicated charging port (DCP) charging during the standby state (S3/S4/S5). The MAX14603/MAX14604/MAX14605/MAX14618 support remote wakeup in standby mode. The MAX14602/MAX14605 offer backward-compatible CDP emulation upgrade to the MAX14566E.
The MAX14600–MAX14605/MAX14618 are available in an 8-pin (2mm x 2mm) TDFN package, and are specified over the -40°C to +85°C extended temperature range.
Part Number | Supported Charging Configurations | Supported USB Battery Charging Specification | Charging Modes | Current Limit Switch Control | CDP Emulation | Remote Wake-Up Support | VBUS Reset Time (sec) | Package/Pins | Budgetary Price | |||||||||||
typ | See Notes | |||||||||||||||||||
MAX14600 |
| 1.2 |
| /CEN | Yes | No | 2 |
| $1.78 @1k | |||||||||||
MAX14602 |
| /CEN | No |
| - | |||||||||||||||
MAX14604 |
| CEN | Yes |
| - | |||||||||||||||
MAX14618 |
| CEN | Yes |
| $1.78 @1k | |||||||||||||||
See All USB Host Adapter Emulator (21) | ||||||||||||||||||||
Pricing Notes: This pricing is BUDGETARY, for comparing similar parts. Prices are in U.S. dollars and subject to change. Quantity pricing may vary substantially and international prices may differ due to local duties, taxes, fees, and exchange rates. For volume-specific and version-specific prices and delivery, please see the price and availability page or contact an authorized distributor. |
Device | Fab Process | Technology | Sample size | Rejects | FIT at 25°C | FIT at 55°C |
Note : The failure rates are summarized by technology and mapped to the associated material part numbers. The failure rates are highly dependent on the number of units tested.
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