MAX3535EEVKIT

MAX3535E Evaluation Kit


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Description

The MAX3535E evaluation kit (EV kit) is a fully assembled and tested PCB that contains a 2500VRMS isolated RS-485/RS-422 transceiver with ESD protection. The EV kit circuit features a differential driver and one receiver. The circuit’s receiver is a 1/8 unit load for the RS-485 bus and communicates up to 1000kbps. The MAX3535E fail-safe circuitry and driver slew-rate features are demonstrated and easily reconfigured.

Additionally, the EV kit features an H-bridge DC-DC converter to power the isolated section of the MAX3535E RS-485/RS-422 circuit. Input power to the circuit is supplied by a +3V to +5.5VDC source. This circuit uses a full-wave rectifier on the unregulated output and provides unregulated voltage to the MAX3535E internal, linear low-dropout (LDO) regulator. Using an H-bridge design minimizes input ripple current and radiated noise. Undervoltage lockout (UVLO) and thermal shutdown provide for a robust, isolated RS-485/RS-422 transceiver circuit and power supply. The surface-mount transformer provides up to 2500VRMS galvanic isolation and the output is powered from a center-tapped, full-wave rectifier circuit to reduce output voltage ripple.

The isolated H-bridge DC-DC converter operation at 420kHz allows the use of ceramic-only output capacitors and a small transformer.

Key Features

  • Designed for 2500VRMS Isolation
  • 1/8 RS-485 Unit Load
  • 1000kbps Full-Duplex RS-485/RS-422 Communication (Configurable for Half Duplex)
  • +3.0V to +5.5VDC Input Range
  • Isolated VCC2 Output
  • Center-Tapped, Full-Wave Rectifier Output
  • 420kHz Switching Frequency
  • Undervoltage Lockout (UVLO) and Thermal Shutdown
  • Low-Cost Integrated-FET H-Bridge Design
  • Fully Assembled and Tested

Quality and Environmental Data

Lead-Free Package Tin (Sn) Whisker Reports
Device   Fab Process   Technology   Sample size   Rejects   FIT at 25°C   FIT at 55°C  

Note : The failure rates are summarized by technology and mapped to the associated material part numbers. The failure rates are highly dependent on the number of units tested.

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