MAX9181

Low-Jitter, Low-Noise LVPECL-to-LVDS Level Translator in an SC70 Package


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Description

The MAX9181 is an LVPECL-to-LVDS level translator that accepts a single LVPECL input and translates it to a single LVDS output. It is ideal for interfacing between LVPECL and LVDS interfaces in systems that require minimum jitter, noise, power, and space.

Ultra-low, 23psP-P added deterministic jitter and 0.6psRMS added random jitter ensure reliable communication in high-speed links that are highly sensitive to timing errors, especially those incorporating clock-and-data recovery, PLLs, serializers, or deserializers. The MAX9181's switching performance guarantees a 400Mbps data rate, but minimizes radiated noise by guaranteeing 0.5ns minimum output transition time.

The MAX9181 operates from a single 3.3V supply and consumes only 10mA supply current over a -40°C to +85°C temperature range. It is available in a tiny 6-pin SC70 package (half the size of a SOT23). Refer to the MAX9180 data sheet for a low-jitter, low-noise LVDS repeater in an SC70 package.
MAX9181: Typical Operating Circuit MAX9181: Typical Operating Circuit Enlarge+

Key Features

  • Tiny SC70 Package
  • Ultra-Low Jitter
    • 23psP-P Added Deterministic Jitter
    • (223 - 1 PRBS)
    • 0.6psRMS Added Random Jitter
  • 0.5ns (min) Transition Time Minimizes Radiated Noise
  • 400Mbps Guaranteed Data Rate
  • Low 10mA Supply Current
  • Conforms to ANSI/EIA/TIA-644 LVDS Standard
  • High-Impedance Inputs and Outputs in Power-Down Mode

Applications/Uses

  • Add/Drop Multiplexers
  • Cell Phone Base Stations
  • Digital Cross-Connects
  • DSLAMs
  • Multidrop Buses
  • Network Routers and Switches

Quality and Environmental Data

Product Reliability Reports: MAX9181.pdf 
Lead-Free Package Tin (Sn) Whisker Reports

Additional Resources

Topmark Coding MAX9181

Tools & Models

  • MAX9181 IBIS Model
  • Device   Fab Process   Technology   Sample size   Rejects   FIT at 25°C   FIT at 55°C  

    Note : The failure rates are summarized by technology and mapped to the associated material part numbers. The failure rates are highly dependent on the number of units tested.

    Quality Management System >
    Environmental Management System >

     
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    Related Resources


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