HART Modem

Fewer External Components and a Small 20-Pin TQFN Package Reduce System Cost and Size

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The DS8500 is a single-chip modem with Highway Addressable Remote Transducer (HART) capabilities. It has been fully tested and verified and has received a HART® Certificate of Registration. The device integrates the modulation and demodulation of the 1200Hz/2200Hz FSK signal, has very low power consumption, and needs only a few external components due to the integrated digital signal processing. The input signal is sampled by an analog-to-digital converter (ADC), followed by a digital filter/demodulator. This architecture ensures reliable signal detection in noisy environments. The output digital-to-analog converter (DAC) generates a sine wave and provides a clean signal with phase- continuous switching between 1200Hz and 2200Hz. Low power is achieved by disabling the receive circuits during transmit and vice versa. The DS8500 is ideal for low-power process control transmitters.
DS8500: Typical Application Circuit DS8500: Typical Application Circuit Enlarge+

Key Features

  • Single-Chip, Half-Duplex Modem Overlays 1200bps FSK Digital Communication on Top of Installed 4mA–20mA Current Loop Infrastructure
  • Digital Signal Processing Provides Reliable Input Signal Detection in Noisy Conditions
  • Standard Component 3.6864MHz Crystal Reduces System Cost
  • Fully Tested and Verified as a HART-Registered Modem IC
  • Integrated Solution Requires Minimal Power and Space
    • 2.7V to 3.6V Operating Voltage
    • 285µA (max) Current Consumption
    • Space-Saving, 5mm x 5mm x 0.8mm, 20-Pin TQFN Package
    • Few External Components Required


  • 4-20mA Loop-Powered Transmitters for Temperature, Pressure, Flow, and Level Measurement
  • HART Modem Interface Connectivity
  • HART Multiplexers

DS8500-KIT: Evaluation Kit for the DS8500
Product Reliability Reports: DS8500.pdf 
Device   Fab Process   Technology   Sample size   Rejects   FIT at 25°C   FIT at 55°C   Material Composition  

Note : The failure rates are summarized by technology and mapped to the associated material part numbers. The failure rates are highly dependent on the number of units tested.

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