MAX3342E

±15kV ESD-Protected USB Level Transceivers in UCSP with USB Detect


Please check latest availability status for a specific part variant.

Description

The MAX3341E/MAX3342E USB transceivers convert logic-level signals to USB signals, and USB signals to logic-level signals. An internal 1.5k? USB termination resistor supports full-speed (12Mbps) USB operation. The MAX3341E/MAX3342E provide built-in ±15kV ESD-protection circuitry on the USB I/O pins, D+ and D-, and VCC.

The MAX3341E/MAX3342E operate with logic supply voltages as low as 1.8V, ensuring compatibility with low-voltage ASICs. The suspend mode lowers supply current to less than 50µA. A unique enumerate feature allows changes in USB communication protocol while power is applied. The MAX3341E/MAX3342E are fully compliant with USB specification 1.1, and full-speed operation under USB specification 2.0.

The MAX3341E/MAX3342E have a USB detect that monitors the USB bus for insertion and signals this event. The MAX3341E USB_DET threshold is between 3.7V (min) and 4V (max), while the MAX3342E USB_DET threshold is between 1V (min) and 2.8V (max).

The MAX3341E/MAX3342E are available in the miniature 4 5 4 UCSP™, as well as the small 16-pin TSSOP, and are specified over the extended temperature range, -40°C to +85°C.

Key Features

  • ±15kV ESD Protection On D+ and D-
  • Comply with USB Standard 1.1 (Full Speed 2.0)
  • USB Skew Independent of Input Skew
  • Separate VP and VM Inputs/Outputs
  • VL Down to 1.8V Allows Connection with Low-Voltage ASICs
  • Reenumerate with Power Applied
  • USB Detect Function
    3.7V (min) to 4V (max)—MAX3341E
    1V (min) to 2.8V (max)—MAX3342E
  • Allow Single-Ended or Differential Logic I/O
  • Internal Linear Regulator Allows Direct Powering from the USB
  • Internal Termination Resistor for Full-Speed Operation
  • Three-State Outputs
  • No Power-Supply Sequencing Required
  • Driver Active in Suspend Mode
  • Available in Miniature Chip-Scale Package
  • Applications/Uses

    • Cell Phones
    • Data Cradles
    • Digital Cameras
    • Information Appliances
    • MP3 Players
    • PC Peripherals
    • PDAs
    Product Reliability Reports: MAX3342E.pdf 
    Device   Fab Process   Technology   Sample size   Rejects   FIT at 25°C   FIT at 55°C   Material Composition  

    Note : The failure rates are summarized by technology and mapped to the associated material part numbers. The failure rates are highly dependent on the number of units tested.

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