MAX3340E

±15kV ESD-Protected USB Level Translators in UCSP

Industry's Smallest ±15kV ESD-Protected USB Level Translators


Please check latest availability status for a specific part variant.

Description

The MAX3340E/MAX3343E bidirectional level translators convert logic-level signals to USB signals, and USB signals to logic-level signals. They include the 1.5kΩ USB termination resistor internally, and support both full-speed (12Mbps) and low-speed (1.5Mbps) USB operation. They have built-in ±15kV ESD protection circuitry to guard the USB I/O pins, D+ and D-.

The MAX3340E/MAX3343E operate with VL at voltages as low as 1.8V, ensuring compatibility with low-voltage ASICs. The MAX3340E/MAX3343E feature a logic- selectable suspend mode that lowers current draw to less than 200µA. The MAX3340E/MAX3343E have a unique reenumerate feature that allows changes in USB communication protocol while the power is on. The MAX3340E/MAX3343E are fully compliant with USB specification 1.1, and the full-speed and low-speed operation under USB specification 2.0.

The MAX3340E/MAX3343E are available in the miniature 4 x 4 chip-scale package, as well as the small 14-pin TSSOP, and are rated for the -40°C to +85°C extended temperature range.

Key Features

  • ±15kV ESD Protection on D+ and D-
  • Internal Linear Regulator Allows Direct Powering from the USB
  • Internal 1.5kΩ Termination Resistor for Low/Full Speed
  • Support Low-Speed and Full-Speed USB Communications
  • Comply with USB Standard 1.1
  • Three-State Outputs
  • Reenumerate with Power Applied
  • Up to 15mA Available from the +3.3V Linear Regulator to Power External Circuitry
  • No Power-Supply Sequencing Required
  • Operate with VL of 1.8V to 3.6V, Ensuring Compatibility with Low-Voltage ASICs
  • Available in Miniature Chip-Scale Package
  • Applications/Uses

    • Cell Phones
    • Data Cradles
    • MP3 Players
    • PC Peripherals
    • PDAs
    Product Reliability Reports: MAX3340E.pdf 
    Device   Fab Process   Technology   Sample size   Rejects   FIT at 25°C   FIT at 55°C   Material Composition  

    Note : The failure rates are summarized by technology and mapped to the associated material part numbers. The failure rates are highly dependent on the number of units tested.

    Quality Management System >
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