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DS2433-Z01

4kb 1-Wire EEPROM

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Quality And Environmental

Request Reliability Report for: DS2433-Z01

Device	Fab Process	Technology	Sample size	Rejects	FIT at 25°C	FIT at 55°C	Material Composition

Note : The failure rates are summarized by technology and mapped to the associated material part numbers. The failure rates are highly dependent on the number of units tested.

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