1024-Bit, 1-Wire EEPROM

1Kb Serial EEPROM Operates from Single-Contact 1-Wire Interface

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The DS28E07 is a 1024-bit, 1-Wire® EEPROM chip organized as four memory pages of 256 bits each. Data is written to an 8-byte scratchpad, verified, and then copied to the EEPROM memory. As a special feature, the four user memory pages can individually be write protected or put in EPROM-emulation mode, where bits can only be changed from a 1 to a 0 state. Each device has its own guaranteed unique 64-bit ROM identification number (ROM ID) that is factory programmed into the chip. The communication follows the 1-Wire protocol with the ROM ID acting as node address in the case of a multiple-device 1-Wire network.

DS28E07: Block Diagram DS28E07: Block Diagram Enlarge+

Key Features

  • Partitioning of Memory Provides Greater Flexibility in Programming User Data
    • 1024 Bits of EEPROM Memory Organized as Four Pages of 256 Bits
    • Individual Memory Pages Can Be Permanently Write Protected or Put in EPROM-Emulation Mode (Write to 0)
  • Advanced 1-Wire Protocol Minimizes Interface to Just Single IO Reducing Required Pin Count and Enhancing Reliability
    • Unique Factory-Programmed, Unalterable 64-Bit Identification Number
    • Switchpoint Hysteresis and Filtering to Optimize Performance in the Presence of Noise
    • Communicates to Host with a Single Digital Signal at 15.4kbps or 125kbps Using 1-Wire Protocol
    • Reads and Writes over a Wide Voltage Range from 3.0V to 5.25V from -40°C to +85°C
    • ±8kV HBM ESD Protection (typ) for IO Pin


  • Accessory/PCB Identification
  • After-Market Management of Consumables
  • Analog Sensor Calibration Including IEEE P1451.4 Smart Sensors
  • Ink and Toner Print Cartridge Identification
  • Medical Sensor Calibration Data Storage

Pricing Notes:
This pricing is BUDGETARY, for comparing similar parts. Prices are in U.S. dollars and subject to change. Quantity pricing may vary substantially and international prices may differ due to local duties, taxes, fees, and exchange rates. For volume-specific and version-specific prices and delivery, please see the price and availability page or contact an authorized distributor.
Request Reliability Report for: DS28E07 
Device   Fab Process   Technology   Sample size   Rejects   FIT at 25°C   FIT at 55°C   Material Composition  

Note : The failure rates are summarized by technology and mapped to the associated material part numbers. The failure rates are highly dependent on the number of units tested.

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