MAX66120

ISO 15693-Compliant 1Kb Memory Fob

Unique Identification and Information About a Person or Object


Please check latest availability status for a specific part variant.

Description

The MAX66120 combines 1024 bits of user EEPROM, a 64-bit unique identifier (UID), and a 13.56MHz ISO 15693 RF interface in a plastic key fob. The memory is organized as 16 blocks of 8 bytes plus two more blocks for data and control registers. Each block has a user-readable write-cycle counter. Four adjacent user EEPROM blocks form a memory page (pages 0 to 3). Memory protection features are write protection and EPROM emulation, which the user can set for each individual memory page. The MAX66120 supports all ISO 15693-defined data rates, modulation indices, subcarrier modes, the selected state, application family identifier (AFI), data storage format identifier (DSFID), and the Option_flag bit for read operations. Memory write access is accomplished through standard ISO 15693 memory and control function commands.
MAX66120: Typical Operating Circuit MAX66120: Typical Operating Circuit Enlarge+

Key Features

  • Fully Compliant with ISO 15693 and ISO 18000-3 Mode 1 Standard
  • 13.56MHz ±7kHz Carrier Frequency
  • 1024-Bit User EEPROM with Block Lock Feature, Write-Cycle Counter, and Optional EPROM-Emulation Mode
  • 64-Bit UID
  • Read and Write (64-Bit Block)
  • Supports AFI and DSFID Function
  • 10ms Programming Time
  • To Fob: 10% or 100% ASK Modulation Using 1/4 (26kbps) or 1/256 (1.6kbps) Pulse-Position Coding
  • From Fob: Load Modulation Using Manchester Coding with 423kHz and 484kHz Subcarrier in Low (6.6kbps) or High (26kbps) Data-Rate Mode
  • 200,000 Write/Erase Cycles (Minimum)
  • 40-Year Data Retention (Minimum)
  • Compatible with Existing 1Kb ISO 15693 Products on the Market
  • Supports the Option_Flag for Read Operations
  • Powered Entirely Through the RF Field
  • Operating Temperature: -25°C to +50°C

Applications/Uses

  • Access Control
  • Asset Tracking
  • Driver Identification (Fleet Application)
Product Reliability Reports: MAX66120.pdf 
Device   Fab Process   Technology   Sample size   Rejects   FIT at 25°C   FIT at 55°C   Material Composition  

Note : The failure rates are summarized by technology and mapped to the associated material part numbers. The failure rates are highly dependent on the number of units tested.

Quality Management System >
Environmental Management System >

 
Status:
Package:
Temperature:

Related Resources