Maxim
›
Products
›
Embedded Security Devices
›
Secure Authentication
›
DS28E38EVKIT

DS28E38EVKIT

Evaluation System for the DS28E38 and DS2476

Download Data Sheet
Subscribe

Please check latest availability status for a specific part variant.

Overview

Description

The DS28E38 evaluation system (EV system) provides the hardware and software necessary to exercise the features of the DS28E38 and DS2476. The EV system consists of five DS28E38/DS2476 devices in a 6-pin TDFN package, a DS9121AQ+ evaluation TDFN socket board, and a DS9481P-300# USB-to-I2C/1-Wire® adapter. The evaluation software runs under Windows® 10, Windows 8, and Windows 7 operating systems, both 64-bit and 32-bit versions. It provides a handy user interface to exercise the features of the DS28E38 and DS2476.

Also see: ChipDNA™ Technology ›


How to Setup the DS28E38 Evaluation Kit and Perform ECDSA Authentication		  
ChipDNA–Defend Your IoT Designs from Hackers		  
Read white paper ›
DS28E38EVKIT: EV System DS28E38EVKIT: EV System Enlarge+

Key Features

  • Demonstrates the Features of the DS28E38 DeepCover® Secure Authenticator with ChipDNA PUF Protection
  • Demonstrates the Features of the DS2476 DeepCover Secure Coprocessor
  • 1-Wire/I2C Communication Is Logged to Aid Firmware Designers Understanding of DS28E38 and DS2476
  • 1-Wire/I2C USB Adapter Creates a Virtual COM Port on Any PC
  • Fully Compliant with USB Specification v2.0
  • Software Runs on Windows 10, Windows 8, and Windows 7 for Both 64-Bit and 32-Bit Versions
  • 3.3V ± 3% 1-Wire Operating Voltage
  • Convenient On-Board Test Points, TDFN Socket
  • Evaluation Software Available by Request

Applications/Uses

  • Authentication of Medical Sensors and Tools
  • IoT Node Authentication
  • Peripheral Authentication
  • Printer Cartridge Identification and Authentication
  • Reference Design License Management
  • Secure Management of Limited Use Consumables

Design Resources

Additional Resources

ECDSA Asymmetric Crypto Security with ChipDNA PUF Protection ›

Quality And Environmental

Device   Fab Process   Technology   Sample size   Rejects   FIT at 25°C   FIT at 55°C   Material Composition  

Note : The failure rates are summarized by technology and mapped to the associated material part numbers. The failure rates are highly dependent on the number of units tested.

Quality Management System >
Environmental Management System >

Order

 
Status:
Package:
Temperature:

Related Resources

New Products


DS28E18
1-Wire® to I2C/SPI Bridge with Command Sequencer

  • Operate Remote I2C or SPI Devices Using Single-Contact 1-Wire Interface
  • No External Power Required
  • Flexible 1-Wire and I2C/SPI Master Operational Modes
  • Easy to Integrate

DS28C16
I²C Low-Voltage SHA-3 Authenticator

  • Robust Countermeasures Protect Against Security Attacks
  • Efficient Secure Hash Algorithm Authenticates Peripherals
  • Supplemental Features Enable Easy Integration into End Applications