1-Wire SHA-1 Authenticator

Provides Low-Cost, World-Class Authentication Security to Protect Your Development Investment

Please check latest availability status for a specific part variant.


The DS28E10 combines secure challenge-and-response authentication functionality based on the FIPS 180-3 specified Secure Hash Algorithm (SHA-1) with 224 bits of one-time programmable user EPROM in a single chip. Once written, the memory is automatically write protected. Additionally, each device has its own guaranteed unique 64-bit ROM identification number (ROM ID) that is factory programmed into the chip. Memory writes are performed 4 bytes at a time. A secure and low-cost factory programming service is available to preprogram device data, including the SHA-1 security data components. The device communicates over the single-contact 1-Wire® bus. The communication follows the standard 1-Wire protocol with the ROM ID acting as node address in the case of a multidevice 1-Wire network.
DS28E10: Typical Operating Circuit DS28E10: Typical Operating Circuit Enlarge+

Key Features

  • Dedicated Hardware-Accelerated SHA-1 Engine for Generating SHA-1 MACs
  • One Page of 28-Byte User OTP EPROM
  • Irreversible Write Protection
  • Unique Factory-Programmed 64-Bit Identification Number
  • 1-Wire Interface for Standard and Overdrive Speeds
  • Communicates with Host at Up to 15.4kbps at Standard Speed or Up to 125kbps in Overdrive Mode
  • Operating Range from 2.8V to 3.6V, -40°C to +85°C
  • 3-Lead SOT23 and 6-Lead TSOC Packages
  • ±6kV Human Body Model (HBM) ESD Protection (typ) on the 1-Wire and VCC Pin


  • Reference Design License Management
  • Sensor/Accessory Authentication and Calibration
  • System Intellectual Property Protection

Pricing Notes:
This pricing is BUDGETARY, for comparing similar parts. Prices are in U.S. dollars and subject to change. Quantity pricing may vary substantially and international prices may differ due to local duties, taxes, fees, and exchange rates. For volume-specific and version-specific prices and delivery, please see the price and availability page or contact an authorized distributor.
Product Reliability Reports: DS28E10.pdf 
Device   Fab Process   Technology   Sample size   Rejects   FIT at 25°C   FIT at 55°C   Material Composition  

Note : The failure rates are summarized by technology and mapped to the associated material part numbers. The failure rates are highly dependent on the number of units tested.

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