DS2477

DeepCover Secure SHA-3 Coprocessor with ChipDNA PUF Protection

Protect Your Development Investment with Crypto-Strong Authentication and Advanced Physical Security


Please check latest availability status for a specific part variant.

Description

The DS2477 secure I²C coprocessor with built-in 1-Wire® master combines FIPS202-compliant secure hash algorithm (SHA-3) challenge and response authentication with Maxim’s patented ChipDNA™ feature, a physically unclonable technology (PUF) to provide a cost-effective solution with the ultimate protection against security attacks. The ChipDNA implementation utilizes the random variation of semiconductor device characteristics that naturally occur during wafer fabrication. The ChipDNA circuit generates a unique output value that is repeatable over time, temperature, and operating voltage. Attempts to probe or observe ChipDNA operation modifies the underlying circuit characteristics thus preventing discovery of the unique value used by the chip cryptographic functions. The DS2477 utilizes the ChipDNA output as key content to cryptographically secure all device-stored data. With ChipDNA capability, the device provides a core set of cryptographic tools derived from integrated blocks including a SHA-3 engine, a FIPS/NIST compliant true random number generator (TRNG), 2Kb of secured EEPROM, and a unique 64-bit ROM identification number (ROM ID). The unique ROM ID is used as a fundamental input parameter for cryptographic operations and serves as an electronic serial number within the application. The DS2477 provides the SHA-3 and memory functionality required by a host system to communicate with and operate a 1-Wire SHA-3 slave. In addition, it performs protocol conversion between the I²C master and any attached 1-Wire SHA-3 slaves. For 1-Wire line driving, internal user-adjustable timers relieve the system host processor from generating time-critical 1-Wire waveforms, supporting both standard and overdrive 1-Wire communication speeds. The 1-Wire line can be powered down under software control. Strong pullup features support 1-Wire power delivery for commands that require higher current consumption.

DS2477: Block Diagram DS2477: Block Diagram Enlarge+

Key Features

  • Robust Countermeasures Protect Against Security Attacks
    • Patented Physically Unclonable Function Secures Device Data
    • Actively Monitored Die Shield Detects and Reacts to Intrusion Attempts
    • All Stored Data Cryptographically Protected from Discovery
  • Efficient Secure Hash Algorithm Authenticates and Manages Peripherals
    • FIPS 202-Compliant SHA-3 Algorithm for Bidirectional Authentication
    • FIPS 198-Compliant Keyed-Hash Message Authentication Code (HMAC)
    • TRNG with NIST SP 800-90B Compliant Entropy Source
  • Supplemental Features Enable Easy Integration into End Applications
    • 2Kb of EEPROM for User Data, Key, and Control Registers
    • One Open-Drain GPIO Pin
    • Unique and Unalterable Factory Programmed 64-Bit Identification Number (ROM ID)
    • Large 1-Wire Block Buffer (126 bytes) for Efficient Data Transfer
    • 1-Wire Standard and Overdrive Timing Communication Speeds
    • I²C Communication, Up to 1MHz
    • Operating Range: 3.3V ±10%, -40°C to +85°C
    • 6-Pin TDFN-EP Package (3mm x 3mm)

Applications/Uses

  • Authentication of Medical Sensors and Tools
  • IoT Node Authentication
  • Peripheral Authentication
  • Printer Cartridge Identification and Authentication
  • Reference Design License Management
  • Secure Management of Limited Use Consumables

Pricing Notes:
This pricing is BUDGETARY, for comparing similar parts. Prices are in U.S. dollars and subject to change. Quantity pricing may vary substantially and international prices may differ due to local duties, taxes, fees, and exchange rates. For volume-specific and version-specific prices and delivery, please see the price and availability page or contact an authorized distributor.

DS28E50EVKIT: Evaluation Kit for the DS28E50 and DS2477
DS28E16EVKIT: Evaluation Kit for the DS28E16 and DS2477
DS28C50EVKIT: Evaluation Kit for the DS28C50 and DS2477
DS28C16EVKIT: Evaluation Kit for the DS28C16 and DS2477
Request Reliability Report for: DS2477 
Device   Fab Process   Technology   Sample size   Rejects   FIT at 25°C   FIT at 55°C   Material Composition  

Note : The failure rates are summarized by technology and mapped to the associated material part numbers. The failure rates are highly dependent on the number of units tested.

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Related Resources


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