MAX9981

825MHz to 915MHz, Dual SiGe High-Linearity Active Mixer

Industry's First Dual SiGe Mixer Reduces Cost, Space, and Component Count for 2.5G and 3G BTS Designs


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Description

The MAX9981 dual high-linearity mixer integrates a local oscillator (LO) switch, LO buffer, LO splitter, and two active mixers. On-chip baluns allow for single-ended RF and LO inputs. The active mixers eliminate the need for an additional IF amplifier because the mixer provides a typical overall conversion gain of 2.1dB.

The MAX9981 active mixers are optimized to meet the demanding requirements of GSM850, GSM900, and CDMA850 base-station receivers. These mixers provide exceptional linearity with an input IP3 of greater than +27dBm. The integrated LO driver allows for a wide range of LO drive levels from -5dBm to +5dBm. In addition, the built-in high-isolation switch enables rapid LO selection of less than 250ns, as needed for GSM transceiver designs.

The MAX9981 is available in a 36-pin QFN package (6mm x 6mm) with an exposed paddle, and is specified over the -40°C to +85°C extended temperature range.
MAX9981: Pin Configuration MAX9981: Pin Configuration Enlarge+

Key Features

  • +27.3dBm Input IP3
  • +13.6dBm Input 1dB Compression Point
  • 825MHz to 915MHz RF Frequency Range
  • 70MHz to 170MHz IF Frequency Range
  • 725MHz to 1085MHz LO Frequency Range
  • 2.1dB Conversion Gain
  • 10.8dB Noise Figure
  • 42dB Channel-to-Channel Isolation
  • -5dBm to +5dBm LO Drive
  • +5V Single-Supply Operation
  • Built-In LO Switch with 52dB LO1 to LO2 Isolation
  • ESD Protection
  • Integrated RF and LO Baluns for Single-Ended Inputs

Applications/Uses

  • Cellular cdmaOne™ and cdma2000® Base Station Receivers
  • Digital and Spread-Spectrum Communication Systems
  • GSM 850/GSM 900 2G and 2.5G EDGE Base Station Receivers
  • Microwave Point-to-Point Links
  • TDMA and Integrated Digital Enhanced Network (iDEN®) Base-Station Receivers
Request Reliability Report for: MAX9981 
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Note : The failure rates are summarized by technology and mapped to the associated material part numbers. The failure rates are highly dependent on the number of units tested.

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