Integrated L1-Band GPS Receiver

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The MAX2741 L1-band GPS receiver IC offers a high-performance, compact solution for mobile handsets and PDA applications. Total voltage gain of 80dB and a 4.7dB cascaded noise figure can provide receiver sensitivity for applications requiring -185dBW for indoor tracking solutions.

This dual-conversion receiver downconverts the 1575.42MHz GPS signal to a 37.38MHz first IF, and then a 3.78MHz second IF. An integrated 2- or 3-bit ADC (1-bit SIGN, 1- or 2-bit MAG selectable) samples the second IF and outputs the digitized signals to the baseband processor.

The integrated synthesizer offers the flexibility in frequency planning to allow a single board design to be employed for reference frequencies from 2MHz to 26MHz. The integrated reference oscillator allows either TCXO or crystal operation.

The receiver runs from a 2.7V to 3.0V supply, and draws only 30mA when active. It is offered in a 28-pin thin QFN package, and is specified for -40°C to +85°C at 3V.

MAX2741: Typical Operating Circuit MAX2741: Typical Operating Circuit Enlarge+

Key Features

  • Supports All Popular Handset Reference Frequencies Up to 26MHz
  • 4.7dB Cascaded Noise Figure
  • 80dB Cascaded Gain
  • Tolerates -90dBm In-Band Jammer
  • Tolerates +13dBm CDMA Out-of-Band Jammer at Device Input
  • Integrated Synthesizer and VCO
  • Integrated 2- or 3-Bit ADC
  • 50dB IF AGC Range
  • Small 28-Pin Thin QFN Package
  • SPI™ Control Interface
  • Clock Output for Baseband Processor


  • Consumer Electronics (Location-Based Games)
  • Digital Cameras/Camcorders
  • Emergency Response Systems
  • Emergency Road-Side Assistance
  • Geographical Information Systems (GIS)
  • In-Vehicle Navigation Systems (IVNS)
  • Location-Based Services/Internet (PDAs)
  • Precision Timing
  • Recreational Handhelds/Walkie-Talkies
  • Telematics (Vehicle and Asset Tracking, Inventory Management)
Request Reliability Report for: MAX2741 
Device   Fab Process   Technology   Sample size   Rejects   FIT at 25°C   FIT at 55°C   Material Composition  

Note : The failure rates are summarized by technology and mapped to the associated material part numbers. The failure rates are highly dependent on the number of units tested.

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