MAX2552

Band III, IV, IX, and X WCDMA Femtocell Transceiver with GSM Monitoring

Accelerate Deployment with Worldwide Field-Proven Performance and the Most Compact Radio Design


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Description

The MAX2552 is a complete single-chip RF-to-bits and bits-to-RF radio transceiver. This device is in compliance with the 3GPP TS25.104 femtocell standard for Band III, IV, IX, and X. It is equipped with multiple receive inputs and transmit outputs for low band, high band, and macro- cell monitoring.

This fully integrated transceiver facilitates compact radio designs for dongle and stand-alone femtocell products by minimizing external component count. Maxim’s MAX-PHY serial interface is used to drastically reduce IC pin count, while worldwide field-proven architecture accelerates time to product deployment.

The device features unparalleled receive blocker performance and the industry’s lowest noise figure for higher data rates and range. Low-power operational modes are available to minimize power consumption. The transmitter is designed to deliver EVM far exceeding the standard requirement at 0dBm.

The MAX2552/MAX2553 is a family of pin-compatible transceivers that cover all major WCDMA and cdma2000® bands. All parts are controlled by a 4-wire interface. The MAX2552 is packaged in a compact 7mm x 7mm TQFN and specified over the -40°C to +85°C extended temperature range. A complete radio reference design is available to facilitate custom designs.

Key Features

  • Single-Chip Femtocell Radio Transceiver
  • WCDMA/HSPA+ Band III, IV, IX, and X Operation
  • TS25.104 Standard Compliant
  • Multiple LNA Inputs for WCDMA, PCS, and GSM Macrocell Monitoring (Bands II, III, IV, V, IX, and X)
  • High Level of Integration
    • On-Chip Fractional-N Frequency Synthesizers for LO Generation
    • No Tx SAW Filters Required
    • Integrated PA Drivers for Lower-Cost Power Amplifier Designs
    • 12-Bit AFC DAC to Control TCXO
    • On-Chip Temperature Sensor
    • Three General-Purpose Outputs
    • Reference Clock with Selectable CMOS and Low Swing Output
    • PLL Lock-Detect Output Through GPO3
  • Optimized Receiver Performance
    • Exceptional Receive Sensitivity
    • High Dynamic Range Sigma-Delta ADCs Allow Simple AGC Implementation with Switched Gain States
  • Optimized Transmitter Performance
    • Factory Calibrated for Gain, Carrier Leakage, and Sideband Suppression
    • 10-Bit Gain-Control Resolution for Better Power Accuracy
    • 60dB Gain-Control Range
  • Loopback Operating Mode from Tx Baseband Input to Rx Baseband Output
  • MAX-PHY Serial Digital Interface
  • SPI Read/Write Functionality
  • Operation Controlled by 4-Wire Serial Interface
  • Low-Cost, 7mm x 7mm TQFN Package

Applications/Uses

  • WCDMA Band III, IV, IX, and X Femtocells
Part NumberFrequency Range
(MHz)
Duplex MethodMobile Technology StandardInputsOutputsInterfaceVSUPPLY
(V)
Rx Supply Current
(mA)
Tx Output Power
(dBm)
Rx Noise Figure
(dB)
Footprint
(mm x mm)
Package/Pins
max
MAX2552 
865 to 894
1710 to 1785
1805 to 1880
1930 to 1995
2110 to 2170
FDD
GSM
WCDMA
1 Rx
3 Monitor
1 TxMaxPHY2.7 to 3.686037.0 x 7.0
TQFN/56
See All Femto RF Transceivers (3)

Part NumberApplicationsDuplex MethodFrequency Range
(MHz)
InputsOutputsTx OIP3 Power
(dBm)
Rx Noise Figure
(dB)
VSUPPLY
(V)
ISUPPLY
(mA)
Footprint
(mm x mm)
max
MAX2552 
GSM
WCDMA
FDD
865 to 894
1710 to 1785
1805 to 1880
1930 to 1995
2110 to 2170
1 Rx
3 Monitor
1 Tx032.7 to 3.6FD High-Band: 3007.0 x 7.0
See All RF Transceivers > 1GHz (12)
Pricing Notes:
This pricing is BUDGETARY, for comparing similar parts. Prices are in U.S. dollars and subject to change. Quantity pricing may vary substantially and international prices may differ due to local duties, taxes, fees, and exchange rates. For volume-specific and version-specific prices and delivery, please see the price and availability page or contact an authorized distributor.

Device   Fab Process   Technology   Sample size   Rejects   FIT at 25°C   FIT at 55°C  

Note : The failure rates are summarized by technology and mapped to the associated material part numbers. The failure rates are highly dependent on the number of units tested.

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