MAX2041EVKIT

Evaluation Kit for the MAX2041


Please check latest availability status for a specific part variant.

Description

The MAX2041 evaluation kit (EV kit) simplifies the evaluation of the MAX2041 UMTS, DCS, and PCS base-station up/downconversion mixer. It is fully assembled and tested at the factory. Standard 50Ω SMA connectors are included on the EV kit's input and output ports to allow quick and easy evaluation on the test bench.

This document provides a list of test equipment required to evaluate the device, a straight-forward test procedure to verify functionality, a description of the EV kit circuit, the circuit schematic, a bill of materials (BOM) for the kit, and artwork for each layer of the PC board.

Key Features

  • Fully Assembled and Tested
  • 50Ω SMA Connectors on Input and Output Ports
  • 1700MHz to 3000MHz RF Frequency Range
  • 1900MHz to 3000MHz LO Frequency Range
  • 1500MHz to 2000MHz LO Frequency Range (MAX2039)
  • DC to 350MHz IF Frequency Range
  • 7.2dB Conversion Loss
  • +33.5dBm Input IP3 (Downconversion)
  • +23.3dBm Input 1dB Compression Point
  • 7.4dB Noise Figure
  • Integrated LO Buffer
  • Integrated RF and LO Baluns
  • Low -3dBm to +3dBm LO Drive
  • Built-In SPDT LO Switch with 43dB LO1 to LO2 Isolation and 50ns Switching Time
  • External Current-Setting Resistor Provides Option for Operating Mixer in Reduced-Power/Reduced- Performance Mode
  • Applications/Uses

    • cdmaOne™ and cdma2000® Base Stations
    • DCS 1800/PCS 1900 EDGE Base Stations
    • Digital and Spread-Spectrum Communication Systems
    • Fixed Broadband Wireless Access
    • Microwave Links
    • Military Systems
    • PHS/PAS Base Stations
    • Predistortion Receivers
    • Private Mobile Radio
    • UMTS/WCDMA Base Stations
    • WiMAX™ Base Stations and Customer Premise Equipment
    • Wireless Local Loop

    Technical Documents

    Tutorial 5100 General Layout Guidelines for RF and Mixed-Signal PCBs

    Quality and Environmental Data

    Lead-Free Package Tin (Sn) Whisker Reports
    Device   Fab Process   Technology   Sample size   Rejects   FIT at 25°C   FIT at 55°C  

    Note : The failure rates are summarized by technology and mapped to the associated material part numbers. The failure rates are highly dependent on the number of units tested.

    Quality Management System >
    Environmental Management System >

     
    Status:
    Package:
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