MAX2027

IF Digitally Controlled Variable-Gain Amplifier

Lowest Noise, Highest Linearity, SiGe Integrated DVGA for Base Stations


Please check latest availability status for a specific part variant.

Description

The MAX2027 high-performance, digitally controlled variable-gain amplifier is designed for use from 50MHz to 400MHz.

The device integrates a digitally controlled attenuator and a high-linearity IF amplifier in one package. Targeted for IF signal chains to adjust gain either dynamically or as a one-time channel gain setting, the MAX2027 is ideal for applications requiring high performance. The attenuator provides 23dB of attenuation range with ±0.05dB state-to-state accuracy.

The MAX2027 is available in a thermally enhanced 20- pin TSSOP-EP package and operates over the -40°C to +85°C temperature range.
MAX2027: Typical Application Circuit MAX2027: Typical Application Circuit Enlarge+

Key Features

  • 50MHz to 400MHz Frequency Range
  • Variable Gain: -8dB to +15dB
  • Output IP3: 35dBm (at All Gain Settings)
  • Noise Figure: 4.7dB at Maximum Gain
  • Digitally Controlled Gain with 1dB Resolution and ±0.05dB State-to-State Accuracy

Applications/Uses

  • Automated Test Equipment (ATE)
  • Broadband Systems
  • Cellular Base Stations
  • Receiver Gain Control
  • Terrestrial Links
  • Transmitter Gain Control

Pricing Notes:
This pricing is BUDGETARY, for comparing similar parts. Prices are in U.S. dollars and subject to change. Quantity pricing may vary substantially and international prices may differ due to local duties, taxes, fees, and exchange rates. For volume-specific and version-specific prices and delivery, please see the price and availability page or contact an authorized distributor.

MAX2027EVKIT: Evaluation Kit for the MAX2027
Request Reliability Report for: MAX2027 
Device   Fab Process   Technology   Sample size   Rejects   FIT at 25°C   FIT at 55°C   Material Composition  

Note : The failure rates are summarized by technology and mapped to the associated material part numbers. The failure rates are highly dependent on the number of units tested.

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