DS33R41

Inverse-Multiplexing Ethernet Mapper with Quad Integrated T1/E1/J1 Transceivers

Greatly Simplifies the Design of Applications for Transporting Ethernet Packets Over Up to Four T1 or E1 Lines


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Description

The DS33R41 extends a 10/100 Ethernet LAN segment by encapsulating MAC frames in HDLC or X.86 (LAPS) for transmission over four interleaved T1/E1/J1 lines using a robust, balanced, and programmable inverse multiplexing. Four integrated T1/E1/J1 transceivers provide framing and line interfacing functionality.

The device performs store-and-forward of packets with full wire-speed transport capability. The built-in committed information rate (CIR) controller provides fractional bandwidth allocation up to the line rate in increments of 512kbps.

DS33R41: Functional Diagram DS33R41: Functional Diagram Enlarge+

Key Features

  • 10/100 IEEE 802.3 Ethernet MAC (MII and RMII) Half/Full Duplex with Automatic Flow Control
  • Layer 1 Inverse Multiplexing Over Four T1/E1/J1 Lines Through the Integrated Framers and LIUs
  • Supports Up to 7.75ms Differential Delay
  • Aggregate Bandwidth from Up to Four T1/E1/J1 Links
  • T1/E1 Signaling Capability for OAM
  • HDLC/LAPS Encapsulation with Programmable FCS, Interframe Fill
  • CIR Controller Provides Fractional Allocations in 512kbps Increments
  • Programmable BERTs
  • External 16MB, 100MHz SDRAM Buffering
  • Parallel Microprocessor Interface
  • 1.8V, 3.3V Power Supplies
  • IEEE 1149.1 JTAG Support

Applications/Uses

  • Bonded Transparent LAN Service
  • Ethernet Delivery Over T1/E1/J1
  • LAN Extension

Technical Documents

App Note 4059 DS33R41 Multichip-Module BSDL Testing
Tutorial 3849 Ethernet-over-PDH Technology Overview

Quality and Environmental Data

Product Reliability Reports: DS33R41.pdf 
Lead-Free Package Tin (Sn) Whisker Reports

CAD Symbols and Footprints

  • DS33R41
  • DS33R41+
  • Device   Fab Process   Technology   Sample size   Rejects   FIT at 25°C   FIT at 55°C  

    Note : The failure rates are summarized by technology and mapped to the associated material part numbers. The failure rates are highly dependent on the number of units tested.

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