3.3V, E1/T1/J1, Short-Haul, Octal Line Interface Unit

Please check latest availability status for a specific part variant.


The DS26303 is an 8-channel short-haul line interface unit (LIU) that supports E1/T1/J1 from a single 3.3V power supply. A wide variety of applications are supported through internal termination or external termination. A single bill of material can support E1/T1/J1 with minimum external components. Redundancy is supported through nonintrusive monitoring, optimal high-impedance modes, and configurable 1:1 or 1+1 backup enhancements. An on-chip synthesizer generates the E1/T1/J1 clock rates by a single master clock input of various frequencies. Two clock output references are also offered.
DS26303: Functional Diagram DS26303: Functional Diagram Enlarge+

Key Features

  • 8 Complete E1, T1, or J1 Short-Haul Line Interface Units
  • Independent E1, T1, or J1 Selections
  • Internal Software-Selectable Transmit and Receive-Side Termination
  • Crystal-Less Jitter Attenuator
  • Selectable Single-Rail and Dual-Rail Mode and AMI or HDB3/B8ZS Line Encoding and Decoding
  • Detection and Generation of AIS
  • Digital/Analog Loss-of-Signal Detection as per T1.231, G.775, and ETS 300 233
  • External Master Clock can be Multiple of 2.048MHz or 1.544MHz for T1/J1 or E1 Operation; This Clock will be Internally Adapted for T1 or E1 Use
  • Built-In BERT Tester for Diagnostics
  • 8-Bit Parallel Interface Support for Intel or Motorola Mode or a 4-Wire Serial Interface
  • Hardware Mode Interface Support
  • Transmit Short-Circuit Protection
  • G.772 Nonintrusive Monitoring
  • Specification Compliance to the Latest T1 and E1 Standards—ANSI T1.102, AT&T Pub 62411, T1.231, T1.403, ITU-T G.703, G.742, G.775, G.823, ETS 300 166, and ETS 300 233
  • Single 3.3V Supply with 5V Tolerant I/O
  • JTAG Boundary Scan as per IEEE 1149.1
  • 144-Pin eLQFP Package


  • ATM and Frame Relay Equipment
  • E1/T1/J1 LAN/WAN Routers
  • E1/T1/J1 Multiplexer and Channel Banks
  • ISDN Primary Rate Interface
  • T1 Digital Cross-Connects
  • Wireless Base Stations
Device   Fab Process   Technology   Sample size   Rejects   FIT at 25°C   FIT at 55°C  

Note : The failure rates are summarized by technology and mapped to the associated material part numbers. The failure rates are highly dependent on the number of units tested.

Quality Management System >
Environmental Management System >


Related Resources