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The DS2174 enhanced bit error rate tester (EBERT) is a software-programmable test-pattern generator, receiver, and analyzer capable of meeting the most stringent error-performance requirements of digital transmission facilities. It features bit-serial, nibble-parallel, and byte-parallel data interfaces, and generates and uniquely synchronizes to pseudorandom patterns of the form 2n - 1, where n can take on values from 1 to 32, and user-defined repetitive patterns of any length up to 512 octets.
DS2174: Block Diagram DS2174: Block Diagram Enlarge+

Key Features

  • Generates and detects digital patterns for analyzing and trouble-shooting digital communications systems
  • Programmable polynomial length and feedback taps for generation of any pseudorandom patterns up to 232 - 1; up to 32 taps can be used in the feedback path
  • Programmable, user-defined pattern registers for long repetitive patterns up to 512 bytes in length
  • Large 48-bit count and bit error count registers
  • Software-programmable bit error insertion
  • Fully independent transmit and receive paths
  • 8-bit parallel-control port
  • Detects polynomial test patterns in the presence of bit error rates up to 10-2
  • Programmable for serial, 4-bit parallel, or 8-bit parallel data interfaces
  • Serial mode clock rate is 155MHz; byte mode is 80MHz for a net 622Mbps; OC-3
  • Available in 44-pin PLCC
Device   Fab Process   Technology   Sample size   Rejects   FIT at 25°C   FIT at 55°C  

Note : The failure rates are summarized by technology and mapped to the associated material part numbers. The failure rates are highly dependent on the number of units tested.

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