10.7Gbps Laser Diode Drivers

Ultra-Low Jitter from Low-Power 10.7Gbps Laser Driver

Please check latest availability status for a specific part variant.


The MAX3930/MAX3931/MAX3932 are designed for direct modulation of laser diodes at data rates up to 10.7Gbps. They provide adjustable laser bias and modulation currents and are implemented using Maxim's second-generation in-house SiGe process.

The MAX3930 accepts differential CML clock and data input signals and includes 50Ω on-chip termination resistors. It delivers a 1mA to 100mA laser bias current and a 20mA to 100mA modulation current with a typical (20% to 80%) 25ps rise time. An input data retiming latch can be used to reject input pattern-dependent jitter if a clock signal is available.

The MAX3931/MAX3932 have an alternate pad out with respect to the MAX3930. The MAX3931 includes the series damping resistor RD on chip.

The MAX3930/MAX3931/MAX3932 also include an adjustable pulse-width control circuit to minimize laser pulse-width distortion.
MAX3930, MAX3931, MAX3932: Typical Application Circuit MAX3930, MAX3931, MAX3932: Typical Application Circuit Enlarge+

Key Features

  • Single +5V or -5.2V Power Supply
  • 108mA Supply Current
  • Operates to 10.7Gbps
  • 50Ω On-Chip Input Termination Resistors
  • Programmable Modulation Current to 100mA
  • Programmable Laser Bias Current to 100mA
  • 25ps Rise Time (MAX3930/MAX3932)
  • Adjustable Pulse-Width Control
  • Selectable Data Retiming Latch
  • ESD Protection
  • Internal Series Damping Resistor (MAX3931)


  • Computers: Desktop, Workstation, Server
  • Section Regenerators
  • SONET OC-192 and SDH STM-64
  • Transmission Systems
  • Up to 10.7Gbps Optical Transmitters

Quality and Environmental Data

Request Reliability Report for: MAX3931 
Lead-Free Package Tin (Sn) Whisker Reports
Device   Fab Process   Technology   Sample size   Rejects   FIT at 25°C   FIT at 55°C  

Note : The failure rates are summarized by technology and mapped to the associated material part numbers. The failure rates are highly dependent on the number of units tested.

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