MAX3892

+3.3V, 2.5Gbps/2.7Gbps, SDH/SONET 4:1 Serializer with Clock Synthesis


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Description

The MAX3892 serializer is ideal for converting 4-bit-wide, 622Mbps parallel data to 2.5Gbps serial data in DWDM and SONET/SDH applications. A 4 x 4-bit FIFO allows for any static delay between the parallel output clock and parallel input clock. Delay variation up to a unit interval (UI) is allowed after reset. A fully integrated phase-locked loop (PLL) synthesizes an internal 2.5GHz serial clock from a 622MHz, 155.5MHz, 77.8MHz, or 38.9MHz reference clock. A selectable dual VCO allows excellent jitter performance at both SONET and forward-error correction (FEC) data rates.

Operating from a single 3.3V supply, this device accepts low-voltage differential-signal (LVDS) clock and data inputs for interfacing with high-speed digital circuitry, and delivers current-mode logic (CML) serial data and clock outputs. A loopback data output is provided to facilitate system diagnostic testing. The MAX3892 is available in the extended temperature range (-40°C to +85°C) in 44-pin QFN and TQFN packages.
MAX3892: Typical Operating Circuit MAX3892: Typical Operating Circuit Enlarge+

Key Features

  • Single +3.3V Supply
  • 455mW Power Consumption
  • 1.4psRMS Maximum Jitter Generation
  • 4 x 4-Bit FIFO Input Buffer
  • 622Mbps/666Mbps Parallel to 2.5Gbps/2.7Gbps Serial Conversion
  • 622MHz/667MHz or 311MHz/333MHz Clock Input
  • On-Chip Clock Synthesizer
  • Multiple Clock Reference Frequencies:
    • (622.08MHz, 155.52MHz, 77.76MHz, 38.88MHz) or (666.51MHz, 166.63MHz, 83.31MHz, 41.66MHz)
  • LVDS Parallel Clock and Data Inputs
  • CML Serial Data and Clock Outputs
  • Additional CML Output for System Loopback Testing

Applications/Uses

  • Add/Drop Multiplexers
  • Backplane Interconnect
  • Dense Digital Cross-Connects
  • SONET/SDH OC-48 Transmission Systems
  • WDM Transponders
Product Reliability Reports: MAX3892.pdf 
Device   Fab Process   Technology   Sample size   Rejects   FIT at 25°C   FIT at 55°C   Material Composition  

Note : The failure rates are summarized by technology and mapped to the associated material part numbers. The failure rates are highly dependent on the number of units tested.

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