MAX3880

+3.3V, 2.488Gbps, SDH/SONET 1:16 Deserializer with Clock Recovery

Low-Power, Low-Cost Transceiver Chipset


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Description

The MAX3880 deserializer with clock recovery is ideal for converting 2.488Gbps serial data to 16-bit-wide, 155Mbps parallel data for SDH/SONET applications. Operating from a single +3.3V supply, this device accepts high-speed serial-data inputs and delivers lowvoltage differential-signal (LVDS) parallel clock and data outputs for interfacing with digital circuitry.

The MAX3880 includes a low-power clock recovery and data retiming function for 2.488Gbps applications. The fully integrated phase-locked loop (PLL) recovers a synchronous clock signal from the serial NRZ data input; the signal is then retimed by the recovered clock. The MAX3880's jitter performance exceeds all SDH/SONET specifications. An additional 2.488Gbps serial input is available for system loopback diagnostic testing. The device also includes a TTL-compatible loss-of-lock (LOL-bar) monitor and LVDS synchronization inputs that enable data realignment and reframing.

The MAX3880 is available in the extended temperature range (-40°C to +85°C) in a 64-pin TQFP-EP (exposed pad) package.
MAX3880: Typical Application Circuit MAX3880: Typical Application Circuit Enlarge+

Key Features

  • Single +3.3V Supply
  • 910mW Operating Power
  • Fully Integrated Clock Recovery and Data Retiming
  • Exceeds ANSI, ITU, and Bellcore Specifications
  • Additional High-Speed Input Facilitates System Loopback Diagnostic Testing
  • 2.488Gbps Serial to 155Mbps Parallel Conversion
  • LVDS Data Outputs and Synchronization Inputs
  • Tolerates >2000 Consecutive Identical Digits
  • Loss-of-Lock Indicator

Applications/Uses

  • 2.488Gbps SDH/SONET Transmission Systems
  • Add/Drop Multiplexers
  • Digital Cross-Connects

Quality and Environmental Data

Request Reliability Report for: MAX3880 
Lead-Free Package Tin (Sn) Whisker Reports
Device   Fab Process   Technology   Sample size   Rejects   FIT at 25°C   FIT at 55°C  

Note : The failure rates are summarized by technology and mapped to the associated material part numbers. The failure rates are highly dependent on the number of units tested.

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