2.7Gbps Laser Driver with Modulation Compensation

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The MAX3863 is designed for direct modulation of laser diodes at data rates up to 2.7Gbps. An automatic power-control (APC) loop is incorporated to maintain a constant average optical power. Modulation compensation is available to increase the modulation current in proportion to the bias current. The optical extinction ratio is then maintained over temperature and lifetime.

The laser driver can modulate laser diodes at amplitudes up to 80mA. Typical (20% to 80%) edge speeds are 50ps. The MAX3863 can supply a bias current up to 100mA. External resistors can set the laser output levels.

The MAX3863 includes adjustable pulse-width control to minimize laser pulse-width distortion. The device offers a failure monitor output to indicate when the APC loop is unable to maintain the average optical power.

The MAX3863 accepts differential CML clock and data input signals with on-chip 50Ω termination resistors. If a clock signal is available, an input data-retiming latch can be used to reject input pattern-dependent jitter. The laser driver is fabricated with Maxim's in-house second-generation SiGe process.
MAX3863: Typical Operating Circuit MAX3863: Typical Operating Circuit Enlarge+

Key Features

  • Single +3.3V Power Supply
  • 58mA Power-Supply Current
  • Up to 2.7Gbps (NRZ) Operation
  • On-Chip Termination Resistors
  • Automatic Power Control (APC)
  • Compensation for Constant Extinction Ratio
  • Programmable Modulation Current Up to 80mA
  • Programmable Bias Current Up to 100mA
  • 50ps Typical Rise/Fall Time
  • Pulse-Width Adjustment Circuit
  • Selectable Data-Retiming Latch
  • Failure Detector
  • Mark-Density Monitor
  • Current Monitors
  • ESD Protection


  • 3.2Gbps Data Communications
  • Add/Drop Multiplexers
  • Digital Cross-Connects
  • Long-Reach Optical Transmitters
  • Section Regenerators
  • SONET and SDH Transmission Systems
  • WDM Transmission Systems
Device   Fab Process   Technology   Sample size   Rejects   FIT at 25°C   FIT at 55°C  

Note : The failure rates are summarized by technology and mapped to the associated material part numbers. The failure rates are highly dependent on the number of units tested.

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