MAX3850

2.7Gbps, +3.3V DC-Coupled Laser Driver


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Description

The MAX3850 is a +3.3V DC-coupled laser driver for SDH/SONET applications up to 2.7Gbps. The device accepts differential data and clock inputs and provides bias and modulation currents for driving a laser. If a clock signal is available, a synchronizing input latch can be used to reduce jitter. An automatic power-control (APC) feedback loop is incorporated to maintain a constant average optical power over temperature and lifetime. The wide modulation current range of 5mA to 60mA (up to 80mA AC-coupled) and bias current of 1mA to 100mA are easy to program, making this product ideal for SDH/SONET applications. The MAX3850 also provides laser current-enable control, two current monitors that are directly proportional to the laser bias and modulation currents, and a failure-monitor output to indicate when the APC loop is unable to maintain the average optical power. Designed to be DC-coupled to the laser with a supply voltage of only 3.3V, the MAX3850 greatly simplifies interface requirements. The MAX3850 is available in a small 32-pin QFN package as well as dice.
MAX3850: Typical Application Circuit MAX3850: Typical Application Circuit Enlarge+

Key Features

  • Single +3.3V Power Supply
  • 35mA Supply Current
  • Programmable Bias Current from 1mA to 100mA
  • Programmable Modulation Current from 5mA to 60mA (Up to 80mA AC-Coupled)
  • Bias Current and Modulation Current Monitors
  • 70ps Rise/Fall Time
  • Automatic Average Power Control with Failure Monitor
  • Complies with ANSI, ITU, and Bellcore SDH/SONET Specifications
  • Laser Current-Enable Control

Applications/Uses

  • Add/Drop Multiplexers
  • Digital Cross-Connects
  • MPLS Transmitter Systems
  • SDH/SONET Transmission Systems
  • Section Regenerators
Device   Fab Process   Technology   Sample size   Rejects   FIT at 25°C   FIT at 55°C  

Note : The failure rates are summarized by technology and mapped to the associated material part numbers. The failure rates are highly dependent on the number of units tested.

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