Compact, Low-Power, 155Mbps to 4.25Gbps Limiting Amplifier

Compact, 155Mbps to 4.25Gbps Multirate SFF/SFP Limiting Amplifier Functions as a Data Quantizer for SONET, Fibre Channel, and Gigabit Ethernet Optical Receivers

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The MAX3748H multirate limiting amplifier functions as a data quantizer for SONET, Fibre Channel, and Gigabit Ethernet optical receivers. The amplifier accepts a wide range of input voltages and provides constant-level current-mode logic (CML) output voltages with controlled edge speeds.

A received-signal-strength indicator (RSSI) is available when the MAX3748H is combined with the MAX3744 SFP transimpedance amplifier (TIA). A receiver consisting of the MAX3744 and the MAX3748H can provide up to 19dB RSSI dynamic range. Additional features include a programmable loss-of-signal (LOS) detect, an optional disable function (DISABLE), and an output signal polarity reversal (OUTPOL). Output disable can be used to implement squelch.

The combination of the MAX3748H and the MAX3744 allows for the implementation of all the small-form-factor SFF-8472 digital diagnostic specifications using a standard 4-pin TO-46 header. The MAX3748H is packaged in a 3mm x 3mm, 16-pin thin QFN package with an exposed pad.
MAX3748H: Typical Operating Circuit MAX3748H: Typical Operating Circuit Enlarge+

Key Features

  • SFP Reference Design Available
  • 16-Pin TQFN Package with 3mm x 3mm Footprint
  • Single 3.3V Supply Voltage
  • 86ps Rise and Fall Time
  • Loss of Signal with Programmable Threshold
  • RSSI Interface (with MAX3744 TIA)
  • Output Disable
  • Polarity Select
  • 8.7psP-P Deterministic Jitter (4.25Gbps)


  • Fibre Channel SFF/SFP Transceiver Modules
  • Gigabit Ethernet SFF/SFP Transceiver Modules
  • Multirate OC-3 to OC-48-FEC SFF/SFP
  • Transceiver Modules

MAX3748HEVKIT: Evaluation Board for the MAX3748H
Product Reliability Reports: MAX3748H.pdf 
Device   Fab Process   Technology   Sample size   Rejects   FIT at 25°C   FIT at 55°C   Material Composition  

Note : The failure rates are summarized by technology and mapped to the associated material part numbers. The failure rates are highly dependent on the number of units tested.

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