MAX3268

+3.0V to +5.5V, 1.25Gbps/2.5Gbps Limiting Amplifiers

Limiting Amplifier with Squelch Function Generates Low Deterministic Jitter


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Description

The 1.25Gbps MAX3264/MAX3268/MAX3768 and the 2.5Gbps MAX3265/MAX3269/MAX3765 limiting amplifiers are designed for Gigabit Ethernet and Fibre Channel optical receiver systems. The amplifiers accept a wide range of input voltages and provide constant-level output voltages with controlled edge speeds. Additional features include RMS power detectors with programmable loss-of-signal (LOS) indication, an optional squelch function that mutes the data output signal when the input voltage falls below a programmable threshold, and excellent jitter performance.

The MAX3264/MAX3265/MAX3765 feature current-mode logic (CML) data outputs that are tolerant of inductive connectors and a 16-pin TSSOP package, making these circuits ideal for GBIC receivers. The MAX3268/ MAX3269/MAX3768 feature standards-compliant positive-referenced emitter-coupled logic (PECL) data outputs and are available in a tiny 10-pin µMAX® package that is ideal for small-form-factor (SFF) receivers.
MAX3264, MAX3265, MAX3268, MAX3269, MAX3765, MAX3768: Typical Operating Circuit MAX3264, MAX3265, MAX3268, MAX3269, MAX3765, MAX3768: Typical Operating Circuit Enlarge+

Key Features

  • +3.0V to +5.5V Supply Voltage
  • Low Deterministic Jitter
    • 14ps (MAX3264)
    • 11ps (MAX3265/MAX3765)
      • 150ps (max) Edge Speed (MAX3265/MAX3765)
      • 300ps (max) Edge Speed (MAX3264)
      • Programmable Signal-Detect Function
      • Choice of CML or PECL Output Interface
      • 10-Pin µMAX or 16-Pin TSSOP Package

Applications/Uses

  • ATM Optical Receivers
  • Fibre Channel Optical Receivers
  • Gigabit Ethernet Optical Receivers
  • System Interconnect

Technical Documents

App Note 468 MAX3265: Using MAX3265 LOS in GBICs
Product Reliability Reports: MAX3268.pdf 
Device   Fab Process   Technology   Sample size   Rejects   FIT at 25°C   FIT at 55°C   Material Composition  

Note : The failure rates are summarized by technology and mapped to the associated material part numbers. The failure rates are highly dependent on the number of units tested.

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