Fast Current Mirror

Provides Optimized APD Bias and Mirror for PON Applications

Please check latest availability status for a specific part variant.


The DS3920 precision current mirror is designed for avalanche photodiode (APD) and PIN photodiode biasing and monitoring applications. The device offers a current clamp to limit current through the APD and a current mirror output that produces a signal proportional (5:1) to the APD current. A diode is also provided to limit the voltage at the current mirror output.

The device accepts a +2.97V to +76V current mirror supply voltage. Internal current limiting (4.4mA or 20mA, typ) protects the monitored device from a short circuit to ground. The provided internal clamp diode protects the current mirror output from overvoltage. Additionally, the device features thermal shutdown if the die temperature reaches +150°C.

The device is available in a 6-pin SOT23 package, and operates over the -40°C to +85°C extended temperature range.

Key Features

  • Wide Voltage Input Range: 2.97V to 76V
  • Current Monitor
    • Wide 250nA to 2mA Range
    • 5:1 Mirror Ratio
    • Fast 50ns Time Constant
  • Current Clamp (4.4mA or 20mA, typ)
  • Voltage Clamp Protects Subsequent Output Circuitry
  • 6-Pin SOT23 (MAX4007 Compatible)


  • Avalanche Photodiode (APD) Biasing
  • PIN Photodiode Monitoring

See parametric specs for Fiber Photodiode Current Monitors (8)

Part NumberPhoto Diode Appl.IDIODEIDIODEVBIAS
Package/PinsOper. Temp.
(min)(max)(max)(See Notes)
DS3920 APD10µA4mA76
-40 to +85$0.63 @1k

Pricing Notes:
This pricing is BUDGETARY, for comparing similar parts. Prices are in U.S. dollars and subject to change. Quantity pricing may vary substantially and international prices may differ due to local duties, taxes, fees, and exchange rates. For volume-specific and version-specific prices and delivery, please see the price and availability page or contact an authorized distributor.
Product Reliability Reports: DS3920.pdf 
Device   Fab Process   Technology   Sample size   Rejects   FIT at 25°C   FIT at 55°C   Material Composition  

Note : The failure rates are summarized by technology and mapped to the associated material part numbers. The failure rates are highly dependent on the number of units tested.

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